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參數(shù)資料
| 型號(hào)： | MAX16049ATN+ |
| 廠商： | MAXIM INTEGRATED PRODUCTS INC |
| 元件分類： | 電源管理 |
| 英文描述： | 8-CHANNEL POWER SUPPLY MANAGEMENT CKT, QCC56 |
| 封裝： | 8 X 8 MM, ROHS COMPLIANT, TQFN-56 |
| 文件頁數(shù)： | 46/61頁 |
| 文件大?。?/td> | 790K |
| 代理商： | MAX16049ATN+ |
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MAX16047A/MAX16049A
12-Channel/8-Channel EEPROM-Programmable
System Managers with Nonvolatile Fault Registers
50
______________________________________________________________________________________
Test Access Port (TAP)
Controller State Machine
The TAP controller is a finite state machine that
responds to the logic level at TMS on the rising edge of
TCK. See Figure 14 for a diagram of the finite state
machine. The possible states are described below:
Test-Logic-Reset: At power-up, the TAP controller is in
the test-logic-reset state. The instruction register con-
tains the IDCODE instruction. All system logic of the
device operates normally. This state can be reached
from any state by driving TMS high for five clock cycles.
Run-Test/Idle: The run-test/idle state is used between
scan operations or during specific tests. The instruction
register and test data registers remain idle.
Select-DR-Scan: All test data registers retain their pre-
vious state. With TMS low, a rising edge of TCK moves
the controller into the capture-DR state and initiates a
scan sequence. TMS high during a rising edge on TCK
moves the controller to the select-IR-scan state.
Capture-DR: Data can be parallel-loaded into the test
data registers selected by the current instruction. If the
instruction does not call for a parallel load or the select-
ed test data register does not allow parallel loads, the
test data register remains at its current value. On the
rising edge of TCK, the controller goes to the shift-DR
state if TMS is low or it goes to the exit1-DR state if TMS
is high.
TEST-LOGIC-RESET
1
11
0
RUN-TEST/IDLE
0
1
0
1
0
1
0
1
0
1
SELECT-DR-SCAN
SELECT-IR-SCAN
CAPTURE-DR
CAPTURE-IR
SHIFT-DR
SHIFT-IR
EXIT1-DR
EXIT1-IR
PAUSE-DR
PAUSE-IR
EXIT2-DR
EXIT2-IR
UPDATE-DR
UPDATE-IR
0
1
0
1
Figure 14. TAP Controller State Diagram
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MAX16049ATN+ | 功能描述:監(jiān)控電路 8Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數(shù): 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16049ATN+T | 功能描述:監(jiān)控電路 8Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數(shù): 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16049ETN+ | 功能描述:監(jiān)控電路 8Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數(shù): 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX16049ETN+T | 功能描述:監(jiān)控電路 8Ch EEPROM Prob System Manager RoHS:否 制造商:STMicroelectronics 監(jiān)測電壓數(shù): 監(jiān)測電壓: 欠電壓閾值: 過電壓閾值: 輸出類型:Active Low, Open Drain 人工復(fù)位:Resettable 監(jiān)視器:No Watchdog 電池備用開關(guān):No Backup 上電復(fù)位延遲（典型值）:10 s 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:UDFN-6 封裝:Reel |
| MAX1604EAI | 功能描述:電源開關(guān) IC - 配電 RoHS:否 制造商:Exar 輸出端數(shù)量:1 開啟電阻（最大值）:85 mOhms 開啟時(shí)間（最大值）:400 us 關(guān)閉時(shí)間（最大值）:20 us 工作電源電壓:3.2 V to 6.5 V 電源電流（最大值）: 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:SOT-23-5 |
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