參數(shù)資料
型號(hào)： KAD5610P-17Q72
廠商： Intersil
文件頁(yè)數(shù)： 7/30頁(yè)
文件大?。?/td> 0K
描述： IC ADC 10BIT 170MSPS DUAL 72-QFN
產(chǎn)品培訓(xùn)模塊： High-Speed Analog-to-Digital Converters
標(biāo)準(zhǔn)包裝： 1
系列： FemtoCharge™
位數(shù)： 10
采樣率（每秒）： 170M
數(shù)據(jù)接口： 串行，SPI?
轉(zhuǎn)換器數(shù)目： 2
功率耗散（最大）： 387mW
電壓電源： 單電源
工作溫度： -40°C ~ 85°C
安裝類(lèi)型： 表面貼裝
封裝/外殼： 72-VFQFN 裸露焊盤(pán)
供應(yīng)商設(shè)備封裝： 72-QFN（10x10）
包裝： 托盤(pán)
輸入數(shù)目和類(lèi)型： 2 個(gè)差分，單極
15
FN6810.2
September 10, 2009
While RESETN is low, the output clock
(CLKOUTP/CLKOUTN) is set low. Normal operation of the
output clock resumes at the next input clock edge
(CLKP/CLKN) after RESETN is deasserted. At 250MSPS
the nominal calibration time is 200ms, while the maximum
calibration time is 550ms.
User-Initiated Reset
Recalibration of the ADC can be initiated at any time by
driving the RESETN pin low for a minimum of one clock
cycle. An open-drain driver with a drive strength of less than
0.5mA is recommended, RESETN has an internal high
impedance pull-up to OVDD. As is the case during power-on
reset, the SDO, RESETN and DNC pins must be in the
proper state for the calibration to successfully execute.
The performance of the KAD5610P changes with variations
in temperature, supply voltage or sample rate. The extent of
these changes may necessitate recalibration, depending on
system performance requirements. Best performance will be
achieved by recalibrating the ADC under the environmental
conditions at which it will operate.
A supply voltage variation of less than 100mV will generally
result in an SNR change of less than 0.1dBFS and SFDR
change of less than 3dBc.
In situations where the sample rate is not constant, best
results will be obtained if the device is calibrated at the
highest sample rate. Reducing the sample rate by less than
75MSPS will typically result in an SNR change of less than
0.1dBFS and an SFDR change of less than 3dBc.
Figures 24 and 25 show the effect of temperature on SNR
and SFDR performance with calibration performed at -40°C,
+25°C, and +85°C. Each plot shows the variation of
SNR/SFDR across temperature after a single calibration at
-40°C, +25°C and +85°C. Best performance is typically
achieved by a user-initiated calibration at the operating
conditions, as stated earlier. However, it can be seen that
performance drift with temperature is not a very strong
function of the temperature at which the calibration is
performed. Full-rated performance will be achieved after
power-up calibration regardless of the operating conditions.
Analog Input
Each ADC core contains a fully differential input
(AINP/AINN, BINP/BINN) to the sample and hold amplifier
(SHA). The ideal full-scale input voltage is 1.45V, centered at
the VCM voltage of 0.535V as shown in Figure 26.
Best performance is obtained when the analog inputs are
driven differentially. The common-mode output voltage,
VCM, should be used to properly bias the inputs as shown in
Figures 27 through 29.
FIGURE 23. CALIBRATION TIMING
CLKP
CLKN
CLKOUTP
RESETN
ORP
CALIBRATION
BEGINS
CALIBRATION
COMPLETE
CALIBRATION
TIME
FIGURE 24. SNR PERFORMANCE vs TEMPERATURE
-4
-3
-2
-1
0
1
2
3
-40
-15
10
35
60
85
SNR
CHANGE
(dBfs
)
CAL DONE AT
+85×
TEMPERATURE (×C
CAL DONE AT
-40×
CAL DONE AT
+25×
FIGURE 25. SFDR PERFORMANCE vs TEMPERATURE
-15
-10
-5
0
5
10
15
-40
-15
10
35
60
85
SFDR
CHANGE
(dBc)
TEMPERATURE (×C
CAL DONE AT
-40×
CAL DONE AT
+25×
CAL DONE AT
+85×
FIGURE 26. ANALOG INPUT RANGE
1.0
1.8
0.6
0.2
1.4
INP
INN
VCM
0.535V
0.725V
KAD5610P
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