參數(shù)資料
型號: JANSR2N7406
廠商: HARRIS SEMICONDUCTOR
元件分類: 功率晶體管
英文描述: 24A, 200V, 0.110 Ohm, Rad Hard, N-Channel Power MOSFET
中文描述: 24 A, 200 V, 0.11 ohm, N-CHANNEL, Si, POWER, MOSFET, TO-254AA
封裝: HERMETIC SEALED, METAL, TO-254AA, 3 PIN
文件頁數(shù): 3/8頁
文件大?。?/td> 71K
代理商: JANSR2N7406
3
Source to Drain Diode Specifications
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
Forward Voltage
V
SD
t
rr
I
SD
= 10A
I
SD
= 10A,dI
SD
/dt = 100A/
μ
s
-0.6
-
-1.8
V
Reverse Recovery Time
-
-
160
ns
Electrical Specifications up to 100K RAD
T
C
= 25
o
C, Unless Otherwise Specified
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
MAX
UNITS
Drain to Source Breakdown Volts
(Note 3)
BV
DSS
V
GS(TH)
I
GSS
I
DSS
V
DS(ON)
r
DS(ON)12
V
GS
= 0, I
D
= 1mA
V
GS
= V
DS
, I
D
= 1mA
V
GS
=
±
20V, V
DS
= 0V
V
GS
= 0, V
DS
= -80V
V
GS
= -12V, I
D
= 10A
V
GS
= -12V, I
D
= 6A
-100
-
V
Gate to Source Threshold Volts
(Note 3)
-2.0
-6.0
V
Gate to Body Leakage
(Notes 2, 3)
-
100
nA
Zero Gate Leakage
(Note 3)
-
25
μ
A
Drain to Source On-State Volts
(Notes 1, 3)
-
-3.10
V
Drain to Source On Resistance
(Notes 1, 3)
-
0.280
NOTES:
1. Pulse test, 300
μ
s Max.
2. Absolute value.
3. Insitu Gamma bias must be sampled for both V
GS
= -12V, V
DS
= 0V and V
GS
= 0V, V
DS
= 80% BV
DSS
.
Single Event Effects (SEB, SEGR)
Note 4
TEST
SYMBOL
ENVIRONMENT
(NOTE 5)
APPLIED
V
GS
BIAS
(V)
(NOTE 6)
MAXIMUM
V
DS
BIAS (V)
-100
ION
SPECIES
TYPICAL LET
(MeV/mg/cm)
TYPICAL
RANGE (
μ
)
Single Event Effects Safe Operating Area
SEESOA
Ni
26
43
20
Br
37
36
10
-100
Br
37
36
15
-80
Br
37
36
20
-50
NOTES:
4. Testing conducted at Brookhaven National Labs; sponsored by Naval Surface Warfare Center (NSWC), Crane, IN.
5. Fluence = 1E5 ions/cm
2
(typical), T
C
= 25
o
C.
6. Does not exhibit Single Event Burnout (SEB) or Single Event Gate Rupture (SEGR).
Performance Curves
FIGURE 1. SINGLE EVENT EFFECTS SAFE OPERATING AREA
FIGURE 2. TYPICAL DRAIN INDUCTANCE REQUIRED TO
LIMIT GAMMA DOT CURRENT TO I
AS
-120
-100
-80
-60
-40
-20
0
0
10
15
20
25
5
V
D
LET = 37MeV/mg/cm
2
, RANGE = 36
μ
FLUENCE = 1E5 IONS/cm
2
(TYPICAL)
TEMP = 25
o
C
LET = 26MeV/mg/cm
2
, RANGE = 43
μ
V
GS
(V)
-300
-100
-10
L
DRAIN SUPPLY (V)
-1000
ILM = 10A
300A
1E-4
1E-5
1E-6
-30
100A
30A
1E-3
1E-7
JANSR2N7440
相關(guān)PDF資料
PDF描述
JANSR2N7407 Formerly Available As FSF254R4, Radiation Hardened, SEGR Resistant, N-Channel Power MOSFETs
JANSR2N7408 Quadruple 2-Input Positive-NAND Gates 14-VQFN -40 to 85
JANSR2N7410 3.5A, 100V, 0.600 Ohm, Rad Hard, N-Channel Power MOSFET
JANSR2N7411 2.5A, -100V, 1.30 Ohm, Rad Hard, P-Channel Power MOSFET
JANSR2N7438 Automotive Catalog Quadruple 2-Input Positive-NAND Gates 14-SOIC -40 to 125
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
JANSR2N7422 制造商:International Rectifier 功能描述:
JANSR2N7422U 制造商:International Rectifier 功能描述:TRAN 100V 100K RAD - Rail/Tube
JANSR2N7423 制造商:International Rectifier 功能描述:200V 15.000A HEXFET RADHARD - Rail/Tube
JANSR2N7423U 制造商:International Rectifier 功能描述:HIREL HEXFET RHD QPL - Bulk
JANSR2N7424 制造商:International Rectifier 功能描述:TRAMSISTOR - Rail/Tube