
IRHN9150, IRHN93150,JANSR-,JANSF-,2N7422U Devices
Pre-Irradiation
8
www.irf.com
Repetitive Rating; Pulse width limited by
maximum junction temperature.
Refer to current HEXFET reliability report.
@ VDD = -25V, Starting TJ = 25°C,
EAS = [0.5 * L * (IL
Peak IL = -22A, VGS = -12V, 25
≤
RG
≤
200
ISD
≤
-22A, di/dt
≤
-450A/
μ
s,
VDD
≤
BVDSS, TJ
≤
150°C
Suggested RG = 2.35
Pulse width
≤
300
μ
s; Duty Cycle
≤
2%
irradiation per MIL-STD-750, method 1019, condition A.
2
) ]
Total Dose Irradiation with VGS Bias.
12 volt VGS applied and VDS = 0 during
irradiation per MIL-STD-750, method 1019, condition A.
Total Dose Irradiation with VDS Bias.
VDS = 0.8 rated BVDSS (pre-Irrradiation)
applied and VGS = 0 during irradiation per
MlL-STD-750, method 1019, condition A.
This test is performed using a flash x-ray
source operated in the e-beam mode (energy
~2.5 MeV), 30 nsec pulse.
All Pre-Irradiation and Post-Irradiation test
conditions are
identical
to facilitate direct
comparison for circuit applications.
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http://www.irf.com/ Data and specifications subject to change without notice. 1/99
Case Outline and Dimensions — SMD-1
SMD-1