Specifications ispLSI 2128E 4 Switching Test Conditions Figure 2. Test Load TEST CONDITION R1 R2 CL A 470 390 35pF B ∞ 390 35pF 470 390 35pF Ac" />
參數(shù)資料
型號: ISPLSI 2128E-100LT176
廠商: Lattice Semiconductor Corporation
文件頁數(shù): 6/11頁
文件大?。?/td> 0K
描述: IC PLD ISP 128I/O 10NS 176TQFP
標準包裝: 40
系列: ispLSI® 2000E
可編程類型: 系統(tǒng)內(nèi)可編程
最大延遲時間 tpd(1): 10.0ns
電壓電源 - 內(nèi)部: 4.75 V ~ 5.25 V
邏輯元件/邏輯塊數(shù)目: 32
宏單元數(shù): 128
門數(shù): 6000
輸入/輸出數(shù): 128
工作溫度: 0°C ~ 70°C
安裝類型: 表面貼裝
封裝/外殼: 176-LQFP
供應商設備封裝: 176-TQFP(24x24)
包裝: 托盤
其它名稱: ISPLSI2128E-100LT176
Specifications ispLSI 2128E
4
Switching Test Conditions
Figure 2. Test Load
TEST CONDITION
R1
R2
CL
A
470
390
35pF
B
390
35pF
470
390
35pF
Active High
Active Low
C
470
390
5pF
390
5pF
Active Low to Z
at V
+0.5V
OL
Active High to Z
at V
-0.5V
OH
Table 2 - 0004A/2000
Output Load Conditions (see Figure 2)
Input Pulse Levels
Table 2-0003/2128E
Input Rise and Fall Time 10% to 90%
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
GND to 3.0V
1.5V
See Figure 2
3-state levels are measured 0.5V from
steady-state active level.
1.5 ns
VOL
SYMBOL
1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
2. Meaured using eight 16-bit counters.
3. Typical values are at VCC = 5V and TA = 25°C.
4. Unused inputs held at 0.0V.
5. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to the
Power Consumption section of this data sheet and the Thermal Management section of the Lattice Semiconductor
Data Book or CD-ROM to estimate maximum ICC.
Table 2-0007/2128E
VOH
IIH
IIL
PARAMETER
IIL-PU
IOS1
ICC3,4
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Operating Power Supply Current
IOL = 8 mA
IOH = -4 mA
0V ≤ VIN ≤ VIL (Max.)
VIL = 0.0V, VIH = 3.0V
CONDITION
MIN.
TYP.
3
MAX. UNITS
2.4
0.4
10
-10
10
V
A
Input or I/O High Leakage Current
VCCIO ≤ VIN ≤ 5.25V
(VCCIO - 0.2)V ≤ VIN ≤ VCCIO
A
I/O Active Pull-Up Current
0V ≤ VIN ≤ 2.0V
-10
-250
A
Output Short Circuit Current
VCCIO = 5.0V or 3.3V, VOUT = 0.5V
-240
mA
165
mA
fTOGGLE = 1 MHz
+ 5V
R1
R2
CL*
Device
Output
Test
Point
*CL includes Test Fixture and Probe Capacitance.
0213A
DC Electrical Characteristics
Over Recommended Operating Conditions
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