- 鎮ㄧ従(xi脿n)鍦ㄧ殑浣嶇疆锛�璨疯常IC缍�(w菐ng) > PDF鐩寗9994 > ISL26323FBZ-T (Intersil)IC ADC 12BIT SPI/SRL 250K 8SOIC PDF璩囨枡涓嬭級
鍙冩暩(sh霉)璩囨枡
| 鍨嬭櫉锛� | ISL26323FBZ-T |
| 寤犲晢锛� | Intersil |
| 鏂囦欢闋佹暩(sh霉)锛� | 8/23闋� |
| 鏂囦欢澶�?銆�?/td> | 0K |
| 鎻忚堪锛� | IC ADC 12BIT SPI/SRL 250K 8SOIC |
| 妯欐簴鍖呰锛� | 2,500 |
| 浣嶆暩(sh霉)锛� | 12 |
| 閲囨ǎ鐜囷紙姣忕锛夛細 | 250k |
| 鏁�(sh霉)鎿�(j霉)鎺ュ彛锛� | 涓茶锛孲PI? |
| 杞夋彌鍣ㄦ暩(sh霉)鐩細 | 1 |
| 鍔熺巼鑰楁暎锛堟渶澶э級锛� | 80mW |
| 闆诲闆绘簮锛� | 鍠浕婧� |
| 宸ヤ綔婧害锛� | -40°C ~ 125°C |
| 瀹夎椤炲瀷锛� | 琛ㄩ潰璨艰 |
| 灏佽/澶栨锛� | 8-SOIC锛�0.154"锛�3.90mm 瀵級 |
| 渚涙噳鍟嗚ō鍌欏皝瑁濓細 | 8-SOIC |
| 鍖呰锛� | 甯跺嵎 (TR) |
| 杓稿叆鏁�(sh霉)鐩拰椤炲瀷锛� | 2 鍊嬪柈绔紝鍠サ |
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ISL26320, ISL26321, ISL26322, ISL26323, ISL26324, ISL26325, ISL26329
16
FN8273.1
September 5, 2013
Serial Digital Interface
The SL26320, ISL26321, ISL26322, ISL26323, ISL26324,
ISL26325 and ISL26329 families utilizes an SPI-compatible
interface to set the device configuration and read conversion
data. This flexible interface provides 3 modes of operation:
Reading After Conversion (RAC), Reading During Conversion
(RDC), and Reading Spanning Conversions (RSC), with an
additional option providing an End of Conversion (EOC) indication
on the SDO output in all 3 modes. The choice of operating mode
is determined by the timing of the signals on the serial interface.
The interface consists of the data clock (SCLK), serial digital
input (SDI), serial digital output (SDO), and the conversion control
input (CNV). From the Idle state (after completion of a prior
conversion), a High-to-Low transition on CNV indicates the
beginning of input signal acquisition, with the Conversion then
initiated by a subsequent Low-to-High transition. When CNV is
Low, input data presented to SDI is latched on the rising edge of
SCLK. Output data will be present at SDO on the falling edge of
SCLK. SDO is in the high-impedance state whenever CNV is High,
and activity on SCLK should be avoided during this time to avoid
corruption of the conversion process. SCLK should be Low when
CNV is High.
During the Nth conversion, output data indicates the conversion
data and configuration settings for the N-1th conversion, while
the current configuration settings apply to the N+1th conversion.
In order to minimize errors due to digital noise coupling, there
should be no activity on the serial interface after the specified
tDATA period. Data should be read before the conversion is
completed to avoid the newer results being overwritten resulting
in a permanent loss of data.
Reading After Conversion Mode Without EOC
In this mode, data transfer always occurs during the Acquisition
phase, supporting the widest variety of interface data rates.
Figure 30 depicts a timing waveform in this mode. From Idle, the
device enters the Acquisition phase when CNV is taken Low. SDO
emerges High from a high-impedance state, waiting for an SCLK
to present the MSB of the current output data word. The
configuration settings can be updated using SDI and at the same
time previous conversion results can be read from SDO. After the
communication is completed or the required acquisition time
(tACQ) has elapsed 鈥� whichever is later 鈥� CNV transitions High
indicating the start of conversion. CNV must be held High
continuously for a minimum of 3.6s (at 250kSPS) so that the
conversion is completed without enabling EOC. Subsequently
CNV may be asserted Low at any time so that the next
Acquisition phase can begin. This method is suitable for hosts
which operate with lower frequency SCLK.
Note that when using slower SPI rates the data transfer time can
exceed the minimum acquisition time, which will limit the
conversion throughput to less than the maximum specified rate.
For example, a 12-bit data transfer takes 12s with a 1MHz SPI
clock. This adds to the 3.6s conversion time for an effective
throughput of 64ksps.
Reading During Conversion Mode
Without EOC
From Idle, the user initiates the input signal Acquisition mode by
taking CNV Low, and then initiates a conversion after tACQ by
pulsing CNV High. After the conversion starts, data is exchanged
on the serial interface while CNV is held Low (see Figure 31). CNV
must also be asserted High before tDATA to avoid enabling EOC.
This method is ideal for hosts with high SCLK communication
rates to operate the device at the highest conversion rates.
At the end of conversion the device enters the Idle state. After the
host is certain that the conversion is completed (3.6s after
conversion is initiated at 250kSPS) a new acquisition can be
initiated by pulling CNV Low which will initiate the Acquisition state.
Reading Spanning Conversion Mode
Without EOC
In applications desiring slower interface data rates and while still
maintaining maximum possible throughput, RSC mode can be
used to transfer data during both the Acquisition and Conversion
phases, as shown in Figure 32.
Data exchange begins during the Acquisition phase until CNV is
asserted High to initiate a conversion and SDO returns to the
high-impedance state, interrupting the exchange. After CNV is
returned Low, SDO will return to the state prior to the CNV pulse
in order to avoid data loss. Once again data exchange occurs
when CNV is Low. CNV must be asserted High before tDATA in
order to avoid enabling EOC.
At the end of conversion the device enters the Idle state. After
the host is certain that the conversion is completed (3.6s after
conversion is initiated at 250kSPS) a new acquisition can be
initiated by pulling CNV Low, which will take the device back to
Acquisition state from Idle state.
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鍙冩暩(sh霉)鎻忚堪 |
|---|---|
| ISL26323FBZ-T7A | 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 250K 8SOIC RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞夋彌鍣� 绯诲垪:- 鐢㈠搧鍩硅〒妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯欐簴鍖呰:250 绯诲垪:- 浣嶆暩(sh霉):12 閲囨ǎ鐜囷紙姣忕锛�:1.8M 鏁�(sh霉)鎿�(j霉)鎺ュ彛:骞惰伅(li谩n) 杞夋彌鍣ㄦ暩(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:1.82W 闆诲闆绘簮:妯℃摤鍜屾暩(sh霉)瀛� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:48-LQFP 渚涙噳鍟嗚ō鍌欏皝瑁�:48-LQFP锛�7x7锛� 鍖呰:绠′欢 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊嬪柈绔�锛屽柈妤� |
| ISL26324 | 鍒堕€犲晢:INTERSIL 鍒堕€犲晢鍏ㄧū:Intersil Corporation 鍔熻兘鎻忚堪:12-bit, 250kSPS Low-power ADCs with Single-ended and Differential Inputs and Multiple Input Channels |
| ISL26324FVZ | 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 16-TSSOP RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞夋彌鍣� 绯诲垪:- 鐢㈠搧鍩硅〒妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯欐簴鍖呰:250 绯诲垪:- 浣嶆暩(sh霉):12 閲囨ǎ鐜囷紙姣忕锛�:1.8M 鏁�(sh霉)鎿�(j霉)鎺ュ彛:骞惰伅(li谩n) 杞夋彌鍣ㄦ暩(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:1.82W 闆诲闆绘簮:妯℃摤鍜屾暩(sh霉)瀛� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:48-LQFP 渚涙噳鍟嗚ō鍌欏皝瑁�:48-LQFP锛�7x7锛� 鍖呰:绠′欢 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊嬪柈绔�锛屽柈妤� |
| ISL26324FVZ-T | 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 16-TSSOP RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞夋彌鍣� 绯诲垪:- 鐢㈠搧鍩硅〒妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯欐簴鍖呰:250 绯诲垪:- 浣嶆暩(sh霉):12 閲囨ǎ鐜囷紙姣忕锛�:1.8M 鏁�(sh霉)鎿�(j霉)鎺ュ彛:骞惰伅(li谩n) 杞夋彌鍣ㄦ暩(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:1.82W 闆诲闆绘簮:妯℃摤鍜屾暩(sh霉)瀛� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:48-LQFP 渚涙噳鍟嗚ō鍌欏皝瑁�:48-LQFP锛�7x7锛� 鍖呰:绠′欢 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊嬪柈绔紝鍠サ |
| ISL26324FVZ-T7A | 鍔熻兘鎻忚堪:IC ADC 12BIT SPI/SRL 4CH 16TSSOP RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 鏁�(sh霉)鎿�(j霉)閲囬泦 - 妯℃暩(sh霉)杞夋彌鍣� 绯诲垪:- 鐢㈠搧鍩硅〒妯″:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 妯欐簴鍖呰:1 绯诲垪:- 浣嶆暩(sh霉):10 閲囨ǎ鐜囷紙姣忕锛�:357k 鏁�(sh霉)鎿�(j霉)鎺ュ彛:DSP锛孧ICROWIRE?锛孮SPI?锛屼覆琛�锛孲PI? 杞夋彌鍣ㄦ暩(sh霉)鐩�:1 鍔熺巼鑰楁暎锛堟渶澶э級:830µW 闆诲闆绘簮:鍠浕婧� 宸ヤ綔婧害:-40°C ~ 85°C 瀹夎椤炲瀷:琛ㄩ潰璨艰 灏佽/澶栨:10-WFDFN 瑁搁湶鐒婄洡 渚涙噳鍟嗚ō鍌欏皝瑁�:10-TDFN-EP锛�3x3锛� 鍖呰:鍓垏甯� (CT) 杓稿叆鏁�(sh霉)鐩拰椤炲瀷:2 鍊嬪柈绔紝鍠サ锛�2 鍊嬪柈绔�锛岄洐妤�锛�1 鍊嬪樊鍒�锛屽柈妤碉紱1 鍊嬪樊鍒�锛岄洐妤� 鐢㈠搧鐩寗闋侀潰:1396 (CN2011-ZH PDF) 鍏跺畠鍚嶇ū:MAX1395ETB+TCT |
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