參數(shù)資料
型號： IDT82P20416DBFG
廠商： IDT, Integrated Device Technology Inc
文件頁數(shù)： 117/121頁
文件大小： 0K
描述： IC LIU T1/E1/J1 16CH SH 484BGA
標準包裝： 84
功能： 線路接口單元（LIU）
接口： E1，J1，T1
電路數(shù)： 16
電源電壓： 1.8V, 3.3V
功率（瓦特）： 3.10W
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 484-LFBGA
供應商設(shè)備封裝： 484-CABGA（19x19）
包裝： 托盤
包括： AIS 警報檢測器和發(fā)生器，回送功能，PRBS 發(fā)生器 / 檢測器，遠程檢測器和發(fā)生器
IDT82P20416
16-CHANNEL SHORT HAUL T1/E1/J1 LINE INTERFACE UNIT
JTAG
95
December 17, 2009
6JTAG
The IDT82P20416 supports the digital Boundary Scan Specification
as described in the IEEE 1149.1 standards.
The boundary scan architecture consists of data and instruction
registers plus a Test Access Port (TAP) controller. The control of the TAP
is achieved through signals applied to the Test Mode Select (TMS) and
Test Clock (TCK) input pins. Data is shifted into the registers via the Test
Data Input (TDI) pin, and shifted out of the registers via the Test Data
Output (TDO) pin. Both TDI and TDO are clocked at a rate determined
by TCK.
The JTAG boundary scan registers include BSR (Boundary Scan
Register), DIR (Device Identification Register), BR (Bypass Register)
and IR (Instruction Register). These will be described in the following
pages. Refer to Figure-36 for architecture.
Figure-36 JTAG Architecture
6.1
JTAG INSTRUCTION REGISTER (IR)
The IR with instruction decode block is used to select the test to be
executed or the data register to be accessed or both.
The instructions include: EXTEST, SAMPLE/PRELOAD, IDCODE,
BYPASS, CLAMP and HIGHZ.
6.2
JTAG DATA REGISTER
6.2.1
DEVICE IDENTIFICATION REGISTER (IDR)
The IDR can be set to define the Version, the Part Number, the
Manufacturer Identity and a fixed bit.
6.2.2
BYPASS REGISTER (BYP)
The BYP consists of a single bit. It can provide a serial path between
the TDI input and the TDO output. Bypassing the BYR will reduce test
access times.
6.2.3
BOUNDARY SCAN REGISTER (BSR)
The bidirectional ports interface to 2 boundary scan cells:
- In cell: The input cell is observable only.
- Out cell: The output cell is controllable and observable.
6.3
TEST ACCESS PORT (TAP) CONTROLLER
The TAP controller is a 16-state synchronous state machine. The
states include: Test Logic Reset, Run-Test/Idle, Select-DR-Scan,
Capture-DR, Shift-DR, Exit1-DR, Pause-DR, Exit2-DR, Update-DR,
Select-IR-Scan, Capture-IR, Shift-IR, Exit1-IR, Pause-IR, Exit2-IR and
Update-IR.
Figure-37 shows the state diagram. Note that the figure contains two
main branches to access either the data or instruction registers. The
value shown next to each state transition in this figure states the value
present at TMS at each rising edge of TCK.
BSR (Boundary Scan Register)
DIR (Device Identification Register)
BR (Bypass Register)
IR (Instruction Register)
MUX
TDO
TDI
TCK
TMS
TRST
Control
MUX
Select
Output Enable
TAP
(Test Access
Port) Controller
相關(guān)PDF資料
PDF描述
IDT82P20516DBFG IC LIU T1/E1/J1 16CH SH 484BGA
IDT82P2281PF TXRX T1/E1/J1 LONG/SHORT 80-TQFP
IDT82P2282PF TXRX T1/J1/E1 2CHAN 100-TQFP
IDT82P2284BB TXRX T1/J1/E1 4CHAN 208-PBGA
IDT82P2288BBG TXRX OCTAL T1/E1/J1 256-PBGA
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
IDT82P20416DBFG8 制造商:Integrated Device Technology Inc 功能描述:IC LIU T1/E1/J1 16CH SH 484BGA
IDT82P20416DBFGBLANK 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:16-Channel Short Haul T1/E1/J1 Line Interface Unit
IDT82P20516 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:16-Channel Short Haul E1 Line Interface Unit
IDT82P20516BFBLANK 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:16-Channel Short Haul E1 Line Interface Unit
IDT82P20516BFGBLANK 制造商:IDT 制造商全稱:Integrated Device Technology 功能描述:16-Channel Short Haul E1 Line Interface Unit
發(fā)布緊急采購，3分鐘左右您將得到回復。

采購需求

(若只采購一條型號，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購。也可以進入我的后臺，查看報價

發(fā)布成功！您可以繼續(xù)發(fā)布采購。也可以進入我的后臺，查看報價

*型號 *數(shù)量 廠商 批號 封裝
添加更多采購

我的聯(lián)系方式

*
*
*