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參數(shù)資料
| 型號： | HY62V8200BLLST-E |
| 廠商： | Hynix Semiconductor Inc. |
| 英文描述： | HY62V8200B Series 256Kx8bit CMOS SRAM |
| 中文描述： | HY62V8200B系列256Kx8bit CMOS SRAM的 |
| 文件頁數(shù)： | 8/12頁 |
| 文件大?。?/td> | 187K |
| 代理商： | HY62V8200BLLST-E |
Y62V8200B Series
Notes(WRITE CYCLE):
1. A write occurs during the overlap of a low /WE, a low /CS1and a high CS2. A write begins at the latest
transition among /CS1 going now, CS2 going high and /WE going low: A write ends at the earliest
transition among /CS1 going high, CS2 low and /WE going high. tWP is measured from the beginning of
write to the end of write. .
2. tCW is measured from the later of /CS1 going low or CS2 going high to the end of write .
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR1 is applied in case a write ends as
/CS1, or /WE going high, and tWR2 is applied in case a write ends at CS2 going low.
5. If /OE, CS2 and /WE are in the read mode during this period, and the I/O pins are in the output low-Z
state, input of opposite phase of the output must not be applied because bus contention can occur.
6. If /CS1 goes low simultaneously with /WE going low, the outputs remain in high impedance state.
7. Dout is the read data of the new address.
8. When /CS1 is low and CS2 is high, I/O pins are in the output state. The input signals in the opposite
phase leading to the outputs should not be applied.
Rev 06 / Apr. 2001
7
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| HY62V8200BLLST-I | HY62V8200B Series 256Kx8bit CMOS SRAM |
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| HY62V8200BLLT1-E | HY62V8200B Series 256Kx8bit CMOS SRAM |
| HY62V8200BLLT1-I | HY62V8200B Series 256Kx8bit CMOS SRAM |
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