參數(shù)資料
型號(hào): HY5DU56822AT-M
廠商: HYNIX SEMICONDUCTOR INC
元件分類: DRAM
英文描述: 256M-S DDR SDRAM
中文描述: 32M X 8 DDR DRAM, 0.75 ns, PDSO66
封裝: 0.400 X 0.875 INCH, 0.65 MM PITCH, TSOP2-66
文件頁(yè)數(shù): 34/36頁(yè)
文件大?。?/td> 374K
代理商: HY5DU56822AT-M
Rev. 0.4/ May. 02 34
HY5DU56422A(L)T
HY5DU56822A(L)T
HY5DU561622A(L)T
14. DQS, DM and DQ input slew rate is specified to prevent double clocking of data and preserve setup and hold times. Signal
transitions through the DC region must be monotonic.
15. tDAL = (tDPL / tCK ) + (tRP / tCK ). For each of the terms above, if not already an integer, round to the next highest integer.
tCK is equal to the actual system clock cycle time.
Example: For DDR266B at CL=2.5 and tCK = 7.5 ns,
tDAL = (15 ns / 7.5 ns) + (20 ns / 7.5 ns) = (2.00) + (2.67)
Round up each non-integer to the next highest integer: = (2) + (3), tDAL = 5 clocks
16. For the parts which do not has internal RAS lockout circuit, Active to Read with Auto precharge delay should be
tRAS - (BL/2) x tCK.
17. tHZ and tLZ transitions occur in the same access time windows as valid data trasitions. These parameters are not referenced
to a specific voltage level but specify when the device output is no longer driving (HZ), or begins driving (LZ).
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