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參數(shù)資料
| 型號： | HS-1840RH883S |
| 廠商： | Intersil Corporation |
| 英文描述： | Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| 中文描述： | 抗輻射16通道CMOS模擬多路復(fù)用器與高?模擬輸入保護 |
| 文件頁數(shù)： | 8/11頁 |
| 文件大小： | 679K |
| 代理商： | HS-1840RH883S |
8
HS-1840RH/883S
Burn-In/Life Test Circuits
DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
NOTES:
VS+ = +15.5V
±
0.5V, VS- = -15.5V
±
0.5V
R = 1k
±
5%
C1 = C2 = 0.01
μ
F
±
10%, 1 each per socket, minimum
D1 = D2 = 1N4002, 1 each per board, minimum
Input Signals: square wave, 50% duty cycle, 0V to 15V peak
±
10%
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16
NOTES:
1. The Above Test Circuits are Utilized for All Package Types
2. The Dynamic Test Circuit is Utilized for All Life Testing
STATIC BURN-IN TEST CIRCUIT
NOTES:
R = 1k
±
5%,
1
/
4
W
C1 = C2 = 0.01
μ
F minimum, 1 each per socket, minimum
VS+ = 15.5V
±
0.5V, VS- = -15.5V
±
0.5V, VR = 15.5
±
0.5V
Irradiation Circuit
28 PIN DIP
NOTE: All irradiation testing is performed in the 28 pin DIP package
R
R
GND
+VS
R
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
F4
F3
F1
F5
F2
-VS
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
R
R
R
GND
VR
+VS
R
-VS
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1K
+15V
+1V
+5V
NC
NC
-15V
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