- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄384441 > HS-1840RH883S (Intersil Corporation) Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection PDF資料下載
參數(shù)資料
| 型號(hào)： | HS-1840RH883S |
| 廠商： | Intersil Corporation |
| 英文描述： | Rad-Hard 16 Channel CMOS Analog Multiplexer with High-Z Analog Input Protection |
| 中文描述： | 抗輻射16通道CMOS模擬多路復(fù)用器與高?模擬輸入保護(hù) |
| 文件頁(yè)數(shù)： | 10/11頁(yè) |
| 文件大?。?/td> | 679K |
| 代理商： | HS-1840RH883S |
10
HS-1840RH/883S
Intersil - Space Level Product Flow
SEM - Traceable to Diffusion Method 2018
Wafer Lot Acceptance Method 5007
Internal Visual Inspection (Note 1)
Gamma Radiation Assurance Tests Method 1019
100% Nondestructive Bond Pull Method 2023
Customer Pre-Cap Visual Inspection (Notes 1, 2)
Temperature Cycling Method 1010 Condition C
Constant Acceleration method 2001 Y1 30KG
Particle Impact Noise Detection method 2020,
Condition A 20G
Marking and Serialization
X-Ray Inspection Method 2012
Initial Electrical Tests (T0)
Static Burn-In 72 Hour, +125
o
C method 1015 Condition A
Room Temperature Electrical Tests (T1)
Burn-In Delta Calculation (T0-T1)
PDA Calculation 3% Functional
5% Subgroups 1, 7,
Dynamic Burn-In 240 Hours, +125
o
C Method 1015
Condition D
Electrical Tests Subgroups 1, 7, 9 (T2)
Burn-In Delta Calculation (T0 - T2)
PDA Calculation 3% Functional
5% Subgroups 1, 7,
Electrical Test +125
o
C, -55
o
C
Alternate Group A Inspection Method 5005
Fine and Gross Leak Tests Method 1014
Customer Source Inspection (Note 2)
Group B Inspection (Notes 2, 4) Method 5005
Group D Inspection (Notes 2, 4) Method 5005
External Visual Inspection Method 2009
Data Package Generation (Note 3)
NOTES:
1. Visual Inspection is performed to MIL-STD-883 Method 2010, Condition A.
2. These steps are optional, and should be listed on the purchase order if required.
3. Data package contains: Assembly Attributes (post seal)
Test Attributes (includes Group A) -55
o
C, +25
o
C, +125
o
C
Shippable Serial Number List
Radiation Testing Certificate of Conformance
Wafer Lot Acceptance Report (includes SEM report)
X-Ray Report and Film
Test Variables Data, DC Test and TELQV
+25
o
C Initial Test
+25
o
C Interim Test 1
+25
o
C Interim Test 2
+25
o
C Delta Over Burn-In
4. Group B data package contains Attributes Data pulse Variables Data, DC Test and TE2HQV. Group D data package contains Attributes only.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HS-2400RH | Radiation Hardened PRAM Four Channel Programmable Operational Amplifier(抗輻射四路可編程運(yùn)算放大器) |
| HS-2420RH | Radiation Hardened Fast Sample and Hold |
| HS1-2420RH-Q | Radiation Hardened Fast Sample and Hold |
| HS-2510RH | Radiation Hardened High Slew Rate Operational Amplifier(抗輻射高輸出電壓轉(zhuǎn)換速率、低偏置電流運(yùn)算放大器) |
| HS7-2510RH-Q | Radiation Hardened High Slew Rate Operational Amplifier |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HS18515 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Schottky Rectifier |
| HS18515_11 | 制造商:MICROSEMI 制造商全稱:Microsemi Corporation 功能描述:180 Amp Schottky ORing Rectifier |
| HS185A1M000A | 制造商:OHMITE 制造商全稱:Ohmite Mfg. Co. 功能描述:Hermetically Sealed Precision Ultra-High Stability Axial Terminals |
| HS185A1M000B | 制造商:OHMITE 制造商全稱:Ohmite Mfg. Co. 功能描述:Hermetically Sealed Precision Ultra-High Stability Axial Terminals |
| HS185A1M000F | 制造商:OHMITE 制造商全稱:Ohmite Mfg. Co. 功能描述:Hermetically Sealed Precision Ultra-High Stability Axial Terminals |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。