參數(shù)資料
型號(hào): FKN2L80
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: 晶閘管
英文描述: Bi-Directional Triode Thyristor Planar Silicon
中文描述: 800 V, 1.5 A, TRIAC, TO-92
封裝: TO-92, 3 PIN
文件頁(yè)數(shù): 2/7頁(yè)
文件大?。?/td> 155K
代理商: FKN2L80
2003 Fairchild Semiconductor Corporation
Rev. A, September 2003
F
Electrical Characteristics
T
C
=25
°
C unless otherwise noted
Notes:
1. Gate Open
2. Measurement using the gate trigger characteristics measurement circuit
3. The critical-rate of rise of the off-state commutating voltage is shown in the table below
4. Case temperature is measured at the T2 terminal 1.5mm away from the molded case.
Quadrant Definitions for a Triac
Symbol
I
DRM
V
TM
Parameter
Test Condition
Min.
-
-
Typ.
-
-
Max.
20
1.6
Units
μ
A
V
Repetieive Peak Off-State Current
On-State Voltage
V
DRM
applied
T
C
=25
°
C, I
TM
=3A
Instantaneous measurement
V
GT
Gate Trigger Voltage
(Note 2)
I
V
D
=12V, R
L
=20
T2(+), Gate (+)
T2(+), Gate (-)
T2(-), Gate (-)
T2(+), Gate (+)
T2(+), Gate (-)
T2(-), Gate (-)
-
-
-
-
-
-
-
-
-
-
-
-
-
1.5
1.5
1.5
10
10
10
-
5
5
5
V
V
V
II
III
I
II
III
I
GT
Gate Trigger Current
(Note 2)
V
D
=12V, R
L
=20
mA
mA
mA
V
mA
mA
mA
V/
μ
s
V
GD
I
H
I
L
Gate Non-Trigger Voltage
Holding Current
Latching Current
T
J
=125
°
C, V
D
=1/2V
DRM
V
D
= 12V, I
TM
= 1A
V
D
= 12V, I
G
= 1.2I
GT
0.2
I, III
II
dv/dt
Critical Rate of Rise of
Off-State Voltag
Critical-Rate of Rise of Off-State
Commutating Voltage
(Note 3)
V
DRM
= Rated, T
j
= 125
°
C,
Exponential Rise
500
(dv/dt)
C
5
-
-
V/
μ
s
V
DRM
(V)
FKN2L80
Test Condition
Commutating voltage and current waveforms
(inductive load)
1. Junction Temperature
T
J
=125
°
C
2. Rate of decay of on-state
commutating current
(di/dt)
C
= - 0.5A/ms
3. Peak off-state voltage
V
D
= 400V
Supply Voltage
Main Current
Main Voltage
Time
Time
Time
V
D
(dv/dt)
C
(di/dt)
C
T2 Positive
+
-
T2 Negative
Quadrant II
Quadrant I
Quadrant III
Quadrant IV
I
GT
-
+ I
GT
(+) T2
(+) I
GT
GATE
T1
(+) T2
(-) I
GATE
T1
(-) T2
(+) I
GT
GATE
T1
(-) T2
(-) I
GATE
T1
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