參數(shù)資料
型號(hào): FBL22031BB
廠商: NXP SEMICONDUCTORS
元件分類: 通用總線功能
英文描述: 9-bit BTL 3.3V latched/registered/pass-thru Futurebus transceiver with 30W termination
中文描述: FBL SERIES, 9-BIT REGISTERED TRANSCEIVER, INVERTED OUTPUT, PQFP52
封裝: PLASTIC, QFP-52
文件頁(yè)數(shù): 9/16頁(yè)
文件大?。?/td> 168K
代理商: FBL22031BB
Philips Semiconductors
Product specification
FBL22031
9-bit BTL 3.3V latched/registered/pass-thru
Futurebus+ transceiver with 30
termination
2000 Apr 18
9
AC ELECTRICAL CHARACTERISTICS
B TO A SPECIFICATIONS
T
amb
= +25
°
C,
V
CC
= 3.3V,
MIN
TYP
MAX
SYMBOL
PARAMETER
TEST
CONDITION
T
amb
= –40 to +85
°
C,
V
CC
= 3.3V
±
10%,
MIN
UNIT
MAX
f
MAX
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PHZ
t
PZL
t
PLZ
t
TLH
t
THL
Maximum clock frequency
Waveform 4
120
150
MHz
Propagation delay (thru mode)
Bn to An
Propagation delay (transparent latch)
Bn to An
Propagation delay
LCBA to An (latch)
Propagation delay
LCBA to An (register)
Propagation delay
SEL0 or SEL1 to An (inverting)
Propagation delay
SEL0 or SEL1 to An (non-inverting)
Output enable time from High or Low
OEA to An
Output disable time to High or Low
OEA to An
Output transition time, An Port
10% to 90%, 90% to 10%
Output to output skew for multiple
channels
1
Pulse skew
2
t
PHL
– t
PLH
MAX
Waveform 1, 2
2.3
2.6
3.2
3.5
6.8
5.5
2.1
2.3
2.7
2.5
2.4
2.6
2.6
3.4
2.1
1.2
5.4
5.6
6.5
6.3
10.4
9.8
4.9
5.2
6.5
6.3
6.6
6.2
5.8
5.4
5.4
3.1
8.9
9.1
10.1
9.3
14.4
14.7
8.4
8.3
10.7
10.5
11.3
10.2
9.3
7.5
9.1
5.4
1.7
2.1
2.4
2.9
5.1
4.3
1.2
1.8
1.8
2.0
1.8
2.1
1.9
2.9
1.6
1.0
0.7
0.5
10.1
10.3
11.6
10.3
16.9
16.8
9.7
9.4
12.8
11.8
13.0
11.6
10.7
9.0
10.1
6.0
3.0
2.0
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
Waveform 1, 2
ns
Waveform 5, 6
ns
Waveform 5, 6
ns
Test Circuit and
Waveforms
ns
t
SK
(o)
Waveform 3
0.5
1.0
1.5
ns
t
SK
(p)
Waveform 2
0.5
1.0
1.5
ns
NOTES:
1.
t
PN
actual – t
PM
actual
for any data input to output path compared to any other data input to output path where N and M are either LH or HL.
Skew times are valid only under same test conditions (temperature, V
CC
, loading, etc.). t
SK
(0) compares t
PLH
on a given path to t
PLH
on any
other path or compares t
on a given path to t
on any other path.
2. t
(p) is used to quantify duty cycle characteristics. In essence it compares the input signal duty cycle to the corresponding output signal
duty cycle (50MHz input frequency and 50% duty cycle, tested on data paths only).
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