參數(shù)資料
型號(hào)： EVAL-AD7376EBZ
廠商： Analog Devices Inc
文件頁(yè)數(shù)： 12/20頁(yè)
文件大小： 0K
描述： BOARD EVAL FOR AD7376
標(biāo)準(zhǔn)包裝： 1
主要目的： 數(shù)字電位器
已用 IC / 零件： AD7376
已供物品： 板
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AD7376
Rev. D | Page 2 of 20
TABLE OF CONTENTS
REVISION HISTORY
8/11—Rev. C to Rev. D
Changes to Output Logic Low Conditions, Table 1..................... 3
Changes to Output Logic Low Conditions, Table 2..................... 5
Changes to Figure 28...................................................................... 14
Updates Outline Dimensions........................................................ 18
7/09—Rev. B to Rev. C
Changes to Features Section............................................................ 1
Updates Outline Dimensions........................................................ 19
Changes to Ordering Guide .......................................................... 20
3/07—Rev. A to Rev. B
Updated Format..................................................................Universal
Changes to Absolute Maximum Ratings....................................... 7
Changes to ESD Protection Section............................................. 14
Changes to Ordering Guide .......................................................... 19
11/05—Rev. 0 to Rev. A
Updated Format..................................................................Universal
Deleted DIP Package..........................................................Universal
Changes to Features ..........................................................................1
Separated Electrical Characteristics into Table 1 and Table 2.....3
Separated Interface Timing into Table 3 ........................................5
Changes to Table 1 Through Table 3...............................................3
Added Table 4 ....................................................................................6
Added Figure 2...................................................................................6
Changes to Absolute Maximum Ratings Section..........................7
Deleted Parametric Test Circuits Section.......................................7
Changes to Typical Performance Characteristics..........................9
Added Daisy-Chain Operation Section ...................................... 14
Added ESD Protection Section..................................................... 14
Added Terminal Voltage Operating Range Section................... 14
Added Power-Up and Power-Down Sequences Section........... 14
Added Layout and Power Supply Biasing Section ..................... 15
Added Applications Section.......................................................... 16
Updated Outline Dimensions....................................................... 18
Changes to Ordering Guide.......................................................... 19
10/97—Revision 0: Initial Version
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