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參數(shù)資料
| 型號： | EVAL-AD5520EBZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 14/24頁 |
| 文件大?。?/td> | 0K |
| 描述： | BOARD EVAL FOR AD5520 |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 主要目的： | 測試與測量，每引腳參數(shù)測量單元（PPMU） |
| 已用 IC / 零件： | AD5520 |
| 已供物品： | 板 |
| 相關(guān)產(chǎn)品： | AD5520JSTZ-ND - IC PPMU SNGL-CH 64-LQFP |
AD5520
Rev. B | Page 21 of 24
TYPICAL APPLICATION CIRCUIT
Figure 27 shows the AD5520 as in an ATE system. This device
can used as a per pin parametric unit in order to speed up the
rate at which testing can be done. It can also be used as a DUT
power supply, as shown in the application circuit.
The central PMU shown in the block diagram (Figure 27) is
usually a highly accurate PMU and is shared among a number
of pins in the tester. In general, many discrete levels are required
in an ATE system for the pin drivers, comparators, clamps, and
active loads. DAC devices, such as the AD5379, offer a highly
integrated solution for a number of these levels. The AD5379 is
a dense 40-channel DAC designed with high channel
requirements, such as ATE.
The flexible function of the AD5520 also makes it suited for use
in instrumentation applications such as source measure units.
Source measure units are programmable instruments capable of
sourcing and measuring voltage or current simultaneously. The
AD5520 provides a more integrated solution in such
equipment.
CENTRAL PMU
ADC
DAC
TIMING DATA
MEMORY
TIMING
GENERATOR
DLL, LOGIC
FORMATTER
DE-SKEW
DAC
VTERM
DRIVER
DAC
IOL
VH
COMP
COMPARE
MEMORY
DAC
ACTIVE LOAD
DAC
VCOM
IOH
DAC
VTH
VTL
VCL
PPMU
ADC
DAC
DEVICE POWER
SUPPLIES
ADC
DAC
GND SENSE
GUARD
AMP
50
Ω COAX
RELAYS
DEVICE UNDER
TEST (DUT)
GUARD AMP
VL
VCH
FORMATTER
DE-SKEW
03701-027
Figure 27. Typical Application ATE Circuit
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