參數(shù)資料
型號(hào): CS61881
英文描述: Octal E1 Analog Front EndLine Interface Units
中文描述: 八路素E1模擬前端底線接口單元
文件頁(yè)數(shù): 10/28頁(yè)
文件大?。?/td> 461K
代理商: CS61881
CS61881
10
DS451PP3
For added flexibility the receive polarity select pin
(RPS) is provided to define whether RPOS/RNEG
have active high or low polarity. In addition, a re-
ceiver power down pin (RPD) is provided that
powers down all receivers and places RPOS,
RNEG, and RCLK into a high impedance state. Fi-
nally, to support applications that employ external
clock recovery, signals on RPOS and RNEG are
XORed and output on RCLK.
2.3 Loss-of-Signal Detector
Each receiver in the CS61881 has an analog loss-
of-signal (LOS) detector for ITU-G.775. An analog
LOS condition will be signaled on ALOS when the
input signal is less than 200 mV for 30
μ
S (Typ).
The LOS condition is cleared once the signal am-
plitude exceeds 250 mV. The ALOS signal will oc-
cur between 10 and 255 bits as specified by ITU
G.775.
Notes: During LOS the RPOS/RNEG outputs will be
active.
2.4 Loopback
The CS61881 provides two loopback modes for
each port. The LOOP pins are used to activate or
disable each port’s loopback operation. When the
LOOP pins are left open, loopback operation is dis-
abled. When a LOOP pin is tied either High or
Low, Local or Remote loopback is enabled respec-
tively.
2.4.1 Local Loopback
Local loopback is selected by driving LOOP High.
In this mode the data being transmitted on
TTIP/TRING is internally connected to the receiv-
er, and the RTIP/RRING inputs are disconnected.
2.4.2 Remote Loopback
Remote Loopback is selected by driving LOOP
Low. In remote loopback, the RPOS/RNEG and
RCLK outputs are internally input to the transmit
circuits for output on TTIP/TRING. In this mode
the TCLK, TPOS, and TNEG inputs are ignored.
2.5 5V Logic Support
The CS61881 provides digital interface pins capa-
ble of interfacing with 5 V logic. The overall power
consumption will still be minimized because the
IC’s core circuitry is powered by 3.3 V supplies.
2.6 JTAG Support
The CS61881 supports the IEEE Boundary Scan
Specification as described in the IEEE 1149.1 stan-
dards. A Test Access Port (TAP) is provided that
consists of the TAP controller, the boundary scan
register (BSR), and the 5 standard pins (TRSTB,
TCK, TMS, TDI, and TDO). A block diagram of
the test access port is shown in Figure 5. The test
clock input (TCK) is used to sample input data on
TDI, and shift output data through TDO. The TMS
input is used to step the TAP controller through its
various states.
The Test Access Port consists of the Tap Control-
ler, Instruction Register, by-pass register, device
ID register, and boundary scan register. The TMS
input is used to manipulate the TAP controller to
allow loading of the instruction and data registers.
The instruction register is used to select test execu-
tion or register access. The by-pass register pro-
vides a direct connection between the TDI input
and the TDO output. The device identification reg-
ister contains an n-bit device identifier.
The Boundary Scan Register is used to support test-
ing of IC inter-connectivity. Using the Boundary
Scan Register, the digital input pins can be sampled
and shifted out on TDO. In addition, this register
can also be used to drive digital output pins to a
user defined state.
2.6.1 TAP Controller
The TAP Controller is a 16 state synchronous state
machine clocked by the rising edge of TCK. The
TMS input governs state transitions as shown in
Figure 6. The value shown next to each state tran-
sition in the diagram is the value that must be on
TMS when it is sampled by the rising edge of TCK.
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