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| 型號(hào)： | CLP200 |
| 英文描述： | OVERVOLTAGE AND OVERCURRENT PROTECTION FOR TELECOM LINE - (ASD) |
| 中文描述： | 過壓和過流保護(hù)的電信線路保護(hù)- （ASD）的 |
| 文件頁(yè)數(shù)： | 8/21頁(yè) |
| 文件大?。?/td> | 360K |
| 代理商： | CLP200 |
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CLP200M
8/21
A or B
B or A
E
15
25
0.2μF
50
20μF
4kv
ITEM
UNDER
TEST
A
B
E
15
25
0.2μF
50
20μF
ITEM
UNDER
TEST
25
4kv
TRANSVERSAL TEST
LONGITUDINAL TEST
Fig. 10 :
Transversal and longitudinal test
topologies.
A
B
<10
ITEM
UNDER
TEST
<10
E
600
600
Fig. 12 :
Power contact test circuit.
A
B
R1
ITEM
UNDER
TEST
R2
1μF
1μF
E
S2
S1
100
Fig. 11 :
Power induction test circuit.
3. CLP200MTESTSRESULTSACCORDINGTO
CCITT K20 RECOMMENDATIONS
3.1 CCITT K20 Recommendations
In respect with the CCITT recommendations, the
CLP200M has to withstand three kinds of distur-
bances.
3.1.1. Lightning simulation
(Test 2, table 2/K20)
This test shall be done in transversal and longitudi-
nal modes as shown in figure 10.
The test generator is the 10/700
μ
s with 4kV of
peak voltage.
3.1.2. Power induction
(Test 3a and 3b, table 2/K20)
Two kinds of tests using the same circuit topology
(see fig.11) are defined in the CCITT K20.
I
Test 3a :
Vac(max) = 300V
RMS
, R1 = R2 = 600
S2 operating and test duration = 200 ms.
I
Test 3b :
Vac(max) = 300V
RMS
(*), R1 = R2 = 200
S2 operating and test duration not defined.
(*) Recommended value.
3.1.3. Power contact (Test 3, table 1/K20)
This test shall be done with the test circuit of figure
12.
Vac(max) = 220V
RMS
, with switch S in each posi-
tion and duration 15 min.
3.1.4. Acceptance criteria and number of tests
Forthetestsdescribedinchapter3.1.1.,3.1.2.and
3.1.3. two criteria are defined :
A: Equipment shall withstand the test without dam-
age and shall operate properly within the specified
limits.
B: A fire hazard should not occur in the equipment
as a result of the tests.
The criteria are affected to the different tests as
mentioned in the table 1.
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