
6-23
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Data Retention Specifications
PARAMETER
SYMBOL
TEST
CONDITIONS
LIMITS
UNITS
V
DR
(V)
V
DD
(V)
+25
o
C, -55
o
C
+125
o
C
MIN
MAX
MIN
MAX
Minimum Data Retention Voltage
(Note 1)
V
DR
-
-
-
2
-
2.5
V
Data Retention Quiescent Current
(Note 1)
I
DD
2
-
-
70
-
380
μ
A
Chip Deselect to Data Retention Time
t
CDR
-
5
450
-
650
-
ns
-
10
Recovery to Normal Operation Time
t
RC
5
5
450
-
650
-
ns
NOTE:
1. Limits designate 100% testing. All other limits are designer’s parameters under given test conditions and do not represent 100% testing.
FIGURE 4. LOW V
DD
DATA RETENTION TIMING WAVEFORMS
FIGURE 5. DYNAMIC/OPERATING BURN-IN CIRCUIT AND TIMING DIAGRAM
DATA RETENTION
MODE
V
DD
CS2
V
IH
V
IL
V
IL
V
IH
t
RC
0.95 V
DD
t
R
t
F
0.95 V
DD
V
DR
t
CDR
22
12
13
14
15
16
17
18
19
21
20
A2
A1
A0
A5
A6
A7
A8
V
DD
A8
A4
A9
A11
A10
01
V
DD
A8
V
DD
A8
V
DD
A3
V
DD
0
1.6
2.2
5.0
6.8
7.2
10.0
μ
s
V
DD
0
V
DD
V
DD
0
0
A1
A0
01
1
11
10
9
8
7
6
5
3
2
4
2k
R
R = 2k
±
20%
2k
R
2k
R
2k
R
PACKAGE
TEMPERATURE
125
o
C
DURATION
V
DD
7V
D
160 Hrs
CDP1822C/3