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參數(shù)資料
| 型號： | CBT6832EDGG |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 通用總線功能 |
| 英文描述： | 16-bit controlled enable rate 1-of-2 multiplexer/demultiplexer with precharged outputs and Schottky undershoot protection for live insertion |
| 中文描述： | CBT/FST/QS/5C/B SERIES, 16 1 LINE TO 2 LINE MULTIPLEXER AND DEMUX/DECODER, TRUE OUTPUT, PDSO56 |
| 封裝： | 6.10 MM, PLASTIC, MO-153, SOT-364-1, TSSOP2-56 |
| 文件頁數(shù)： | 3/8頁 |
| 文件大?。?/td> | 67K |
| 代理商： | CBT6832EDGG |
Philips Semiconductors
Product specification
CBT6832E
16-bit controlled enable rate 1-of-2 multiplexer/demultiplexer with precharged
outputs and Schottky undershoot protection for live insertion
2000 Sep 01
3
PIN DESCRIPTION
PIN NUMBER
SYMBOL
NAME AND FUNCTION
3, 6, 9, 12, 17,
20, 23, 26, 33,
36, 39, 42, 47,
50, 53, 56
1A1–16A1
Inputs
1, 2, 4, 5, 7, 8,
10, 11, 15, 16,
18, 19, 21, 22,
24, 25
1B1–16B1
Outputs
31, 32, 34, 35,
37, 38, 40, 41,
45, 46, 48, 49,
51, 52, 54, 55
1B2–16B2
Outputs
27, 30
V
BIAS1
,
V
BIAS2
SEL1, SEL2
Precharge bias voltage inputs
28, 29
Select-control inputs
13, 44
GND
Ground (0 V)
14, 43
V
CC
Positive supply voltage
FUNCTION TABLE
SEL1
SEL2
FUNCTION
L
H
nA to nB1
H
L
nA to nB2
L
L
nA to nB1 and nB2
H
H
nB1, nB2 = V
BIAS
LOGIC DIAGRAM
V
BIAS1
PULLUP
1B1
V
BIAS2
PULLUP
1B2
V
BIAS1
PULLUP
16B1
V
BIAS2
PULLUP
16B2
1A
16A
SEL1
SEL2
SV01801
ABSOLUTE MAXIMUM RATINGS
1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
V
I
V
OUT
I
OUT
T
stg
Θ
JA
DC supply voltage
–0.5 to +7.0
V
DC input diode current
DC input voltage
3
DC output voltage
3
V
I
< 0
–50
mA
–0.5 to +7.0
V
output in Off or High state
–0.5 to +7.0
V
DC output current
output in Low state
120
mA
°
C
°
C/W
Storage temperature range
–65 to +150
Power dissipation
95
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150
°
C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
4.5
MAX
5.5
V
CC
V
IH
V
IL
T
amb
DC supply voltage
V
High-level input voltage
2.0
V
Low-level Input voltage
0.8
V
°
C
Operating free-air temperature range
0
+70
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