ProASICPLUS Flash Family FPGAs 2- 8 v5.9 Boundary Scan (JTAG) P" />
鍙冩暩(sh霉)璩囨枡
鍨嬭櫉锛� APA150-FGG144
寤犲晢锛� Microsemi SoC
鏂囦欢闋佹暩(sh霉)锛� 89/178闋�
鏂囦欢澶�?銆�?/td> 0K
鎻忚堪锛� IC FPGA PROASIC+ 150K 144-FBGA
妯欐簴鍖呰锛� 160
绯诲垪锛� ProASICPLUS
RAM 浣嶇附瑷堬細 36864
杓稿叆/杓稿嚭鏁�(sh霉)锛� 100
闁€鏁�(sh霉)锛� 150000
闆绘簮闆诲锛� 2.3 V ~ 2.7 V
瀹夎椤炲瀷锛� 琛ㄩ潰璨艰
宸ヤ綔婧害锛� 0°C ~ 70°C
灏佽/澶栨锛� 144-LBGA
渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁濓細 144-FPBGA锛�13x13锛�
绗�1闋�绗�2闋�绗�3闋�绗�4闋�绗�5闋�绗�6闋�绗�7闋�绗�8闋�绗�9闋�绗�10闋�绗�11闋�绗�12闋�绗�13闋�绗�14闋�绗�15闋�绗�16闋�绗�17闋�绗�18闋�绗�19闋�绗�20闋�绗�21闋�绗�22闋�绗�23闋�绗�24闋�绗�25闋�绗�26闋�绗�27闋�绗�28闋�绗�29闋�绗�30闋�绗�31闋�绗�32闋�绗�33闋�绗�34闋�绗�35闋�绗�36闋�绗�37闋�绗�38闋�绗�39闋�绗�40闋�绗�41闋�绗�42闋�绗�43闋�绗�44闋�绗�45闋�绗�46闋�绗�47闋�绗�48闋�绗�49闋�绗�50闋�绗�51闋�绗�52闋�绗�53闋�绗�54闋�绗�55闋�绗�56闋�绗�57闋�绗�58闋�绗�59闋�绗�60闋�绗�61闋�绗�62闋�绗�63闋�绗�64闋�绗�65闋�绗�66闋�绗�67闋�绗�68闋�绗�69闋�绗�70闋�绗�71闋�绗�72闋�绗�73闋�绗�74闋�绗�75闋�绗�76闋�绗�77闋�绗�78闋�绗�79闋�绗�80闋�绗�81闋�绗�82闋�绗�83闋�绗�84闋�绗�85闋�绗�86闋�绗�87闋�绗�88闋�鐣跺墠绗�89闋�绗�90闋�绗�91闋�绗�92闋�绗�93闋�绗�94闋�绗�95闋�绗�96闋�绗�97闋�绗�98闋�绗�99闋�绗�100闋�绗�101闋�绗�102闋�绗�103闋�绗�104闋�绗�105闋�绗�106闋�绗�107闋�绗�108闋�绗�109闋�绗�110闋�绗�111闋�绗�112闋�绗�113闋�绗�114闋�绗�115闋�绗�116闋�绗�117闋�绗�118闋�绗�119闋�绗�120闋�绗�121闋�绗�122闋�绗�123闋�绗�124闋�绗�125闋�绗�126闋�绗�127闋�绗�128闋�绗�129闋�绗�130闋�绗�131闋�绗�132闋�绗�133闋�绗�134闋�绗�135闋�绗�136闋�绗�137闋�绗�138闋�绗�139闋�绗�140闋�绗�141闋�绗�142闋�绗�143闋�绗�144闋�绗�145闋�绗�146闋�绗�147闋�绗�148闋�绗�149闋�绗�150闋�绗�151闋�绗�152闋�绗�153闋�绗�154闋�绗�155闋�绗�156闋�绗�157闋�绗�158闋�绗�159闋�绗�160闋�绗�161闋�绗�162闋�绗�163闋�绗�164闋�绗�165闋�绗�166闋�绗�167闋�绗�168闋�绗�169闋�绗�170闋�绗�171闋�绗�172闋�绗�173闋�绗�174闋�绗�175闋�绗�176闋�绗�177闋�绗�178闋�
ProASICPLUS Flash Family FPGAs
2- 8
v5.9
Boundary Scan (JTAG)
ProASICPLUS devices are compatible with IEEE Standard
1149.1, which defines a set of hardware architecture and
mechanisms for cost-effective, board-level testing. The
basic ProASICPLUS boundary-scan logic circuit is composed
of the TAP (test access port), TAP controller, test data
registers, and instruction register (Figure 2-9). This circuit
supports all mandatory IEEE 1149.1 instructions (EXTEST,
SAMPLE/PRELOAD
and
BYPASS)
and
the
optional
IDCODE instruction (Table 2-6).
Each test section is accessed through the TAP, which has
five associated pins: TCK (test clock input), TDI and TDO
(test data input and output), TMS (test mode selector)
and TRST (test reset input). TMS, TDI and TRST are
equipped with pull-up resistors to ensure proper
operation when no input data is supplied to them. These
pins are dedicated for boundary-scan test usage. Actel
recommends that a nominal 20 k
惟 pull-up resistor is
added to TDO and TCK pins.
The TAP controller is a four-bit state machine (16 states)
that operates as shown in Figure 2-10 on page 2-9. The
1s and 0s represent the values that must be present at
TMS at a rising edge of TCK for the given state transition
to occur. IR and DR indicate that the instruction register
or the data register is operating in that state.
ProASICPLUS devices have to be programmed at least
once for complete boundary-scan functionality to be
available. Prior to being programmed, EXTEST is not
available. If boundary-scan functionality is required prior
to programming, refer to online technical support on the
Actel website and search for ProASICPLUS BSDL.
Figure 2-9 ProASICPLUS JTAG Boundary Scan Test Logic Circuit
Device
Logic
TDI
TCK
TMS
TRST
TDO
I/O
Bypass Register
Instruction
Register
TAP
Controller
Test Data
Registers
Table 2-6
Boundary-Scan Opcodes
Hex Opcode
EXTEST
00
SAMPLE/PRELOAD
01
IDCODE
0F
CLAMP
05
BYPASS
FF
Table 2-6
Boundary-Scan Opcodes
Hex Opcode
鐩搁棞(gu膩n)PDF璩囨枡
PDF鎻忚堪
APA150-FG144 IC FPGA PROASIC+ 150K 144-FBGA
AMM25DRSD-S288 CONN EDGECARD 50POS .156 EXTEND
RSA50DRMI CONN EDGECARD 100POS .125 SQ WW
RMA50DRMI CONN EDGECARD 100POS .125 SQ WW
HSM10DREF CONN EDGECARD 20POS .156 EYELET
鐩搁棞(gu膩n)浠g悊鍟�/鎶€琛�(sh霉)鍙冩暩(sh霉)
鍙冩暩(sh霉)鎻忚堪
APA150-FGG144A 鍔熻兘鎻忚堪:IC FPGA PROASIC+ 150K 144-FBGA RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 宓屽叆寮� - FPGA锛堢従(xi脿n)鍫村彲绶ㄧ▼闁€闄e垪锛� 绯诲垪:ProASICPLUS 妯欐簴鍖呰:90 绯诲垪:ProASIC3 LAB/CLB鏁�(sh霉):- 閭忚集鍏冧欢/鍠厓鏁�(sh霉):- RAM 浣嶇附瑷�:36864 杓稿叆/杓稿嚭鏁�(sh霉):157 闁€鏁�(sh霉):250000 闆绘簮闆诲:1.425 V ~ 1.575 V 瀹夎椤炲瀷:琛ㄩ潰璨艰 宸ヤ綔婧害:-40°C ~ 125°C 灏佽/澶栨:256-LBGA 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:256-FPBGA锛�17x17锛�
APA150-FGG144I 鍔熻兘鎻忚堪:IC FPGA PROASIC+ 150K 144-FBGA RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 宓屽叆寮� - FPGA锛堢従(xi脿n)鍫村彲绶ㄧ▼闁€闄e垪锛� 绯诲垪:ProASICPLUS 妯欐簴鍖呰:40 绯诲垪:SX-A LAB/CLB鏁�(sh霉):6036 閭忚集鍏冧欢/鍠厓鏁�(sh霉):- RAM 浣嶇附瑷�:- 杓稿叆/杓稿嚭鏁�(sh霉):360 闁€鏁�(sh霉):108000 闆绘簮闆诲:2.25 V ~ 5.25 V 瀹夎椤炲瀷:琛ㄩ潰璨艰 宸ヤ綔婧害:0°C ~ 70°C 灏佽/澶栨:484-BGA 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:484-FPBGA锛�27X27锛�
APA150-FGG256 鍔熻兘鎻忚堪:IC FPGA PROASIC+ 150K 256-FBGA RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 宓屽叆寮� - FPGA锛堢従(xi脿n)鍫村彲绶ㄧ▼闁€闄e垪锛� 绯诲垪:ProASICPLUS 妯欐簴鍖呰:90 绯诲垪:ProASIC3 LAB/CLB鏁�(sh霉):- 閭忚集鍏冧欢/鍠厓鏁�(sh霉):- RAM 浣嶇附瑷�:36864 杓稿叆/杓稿嚭鏁�(sh霉):157 闁€鏁�(sh霉):250000 闆绘簮闆诲:1.425 V ~ 1.575 V 瀹夎椤炲瀷:琛ㄩ潰璨艰 宸ヤ綔婧害:-40°C ~ 125°C 灏佽/澶栨:256-LBGA 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:256-FPBGA锛�17x17锛�
APA150-FGG256A 鍔熻兘鎻忚堪:IC FPGA PROASIC+ 150K 256-FBGA RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 宓屽叆寮� - FPGA锛堢従(xi脿n)鍫村彲绶ㄧ▼闁€闄e垪锛� 绯诲垪:ProASICPLUS 妯欐簴鍖呰:90 绯诲垪:ProASIC3 LAB/CLB鏁�(sh霉):- 閭忚集鍏冧欢/鍠厓鏁�(sh霉):- RAM 浣嶇附瑷�:36864 杓稿叆/杓稿嚭鏁�(sh霉):157 闁€鏁�(sh霉):250000 闆绘簮闆诲:1.425 V ~ 1.575 V 瀹夎椤炲瀷:琛ㄩ潰璨艰 宸ヤ綔婧害:-40°C ~ 125°C 灏佽/澶栨:256-LBGA 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:256-FPBGA锛�17x17锛�
APA150-FGG256I 鍔熻兘鎻忚堪:IC FPGA PROASIC+ 150K 256-FBGA RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 宓屽叆寮� - FPGA锛堢従(xi脿n)鍫村彲绶ㄧ▼闁€闄e垪锛� 绯诲垪:ProASICPLUS 妯欐簴鍖呰:40 绯诲垪:SX-A LAB/CLB鏁�(sh霉):6036 閭忚集鍏冧欢/鍠厓鏁�(sh霉):- RAM 浣嶇附瑷�:- 杓稿叆/杓稿嚭鏁�(sh霉):360 闁€鏁�(sh霉):108000 闆绘簮闆诲:2.25 V ~ 5.25 V 瀹夎椤炲瀷:琛ㄩ潰璨艰 宸ヤ綔婧害:0°C ~ 70°C 灏佽/澶栨:484-BGA 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:484-FPBGA锛�27X27锛�