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| 型號(hào)： | AM29LV2562MH120RPII |
| 廠商： | SPANSION LLC |
| 元件分類： | DRAM |
| 英文描述： | 512 Megabit (16 M x 32-Bit/32 M x 16-Bit) MirrorBit 3.0 Volt-only Uniform Sector Flash Memory with VersatileI/O Control |
| 中文描述： | 16M X 32 FLASH 3V PROM, 120 ns, PBGA80 |
| 封裝： | 18 X 12 MM, FBGA-80 |
| 文件頁(yè)數(shù)： | 52/69頁(yè) |
| 文件大?。?/td> | 1451K |
| 代理商： | AM29LV2562MH120RPII |
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50
Am29LV2562M
October 9, 2003
P R E L I M I N A R Y
TEST CONDITIONS
Table 13.
Test Specifications
KEY TO SWITCHING WAVEFORMS
2.7 k
C
L
6.2 k
3.3 V
Device
Under
Test
Note:
Diodes are IN3064 or equivalent.
Figure 11.
Test Setup
Test Condition
All Speeds
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–3.0
V
Input timing measurement
reference levels (See Note)
1.5
V
Output timing measurement
reference levels
0.5 V
CC
V
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
3.0 V
0.0 V
1.5 V
0.5 V
IO
V
Output
Measurement Level
Input
Figure 12.
Input Waveforms and
Measurement Levels
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