參數(shù)資料
型號: Alpha 21164
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: Alpha Microprocessor(64位微處理器)
中文描述: 阿爾法微處理器(64位微處理器)
文件頁數(shù): 98/115頁
文件大?。?/td> 846K
代理商: ALPHA 21164
98
Electrical Data
AC Characteristics
Signals in Table 35 are used to control Bcache data transfers. These signals are
driven off the CPU clock. The choice of
sys_clk_out
or
ref_clk_in
has no impact on
the timing of these signals.
11.4.5 Timing of Test Features
Timing of 21164 testability features depends on the system clock rate and the test
port’s operating mode. This section provides timing information that may be needed
for most common operations.
1
Pulse width for this signal is controlled through the BC_CONFIG IPR.
2
The value 0.4 ns accounts for onchip driver and clock skew.
3
For big drive enabled or big drive disabled, respectively. See Table 29.
4
The value 0.2 ns accounts for onchip driver and clock skew.
5
For chip speeds greater than 500 MHz,
Tmdd
is 0.6 ns.
Table 35 Bcache Control Signal Timing
Value
Signal
Specification
366 MHz–500 MHz Faster than 500 MHz Name
Input mode:
tag_data_h
,
tag_data_par_h
,
tag_valid_h
Input setup
1.2 ns
1.1 ns
Tdsu
tag_data_h
,
tag_data_par_h
,
tag_valid_h
Input hold
0 ns
0.1 ns
Tdh
Output mode:
data_ram_oe_h
,
data_ram_we_h
,
1
tag_ram_oe_h
,
tag_ram_we_h
1
Output delay
Tbedd
+ 0.4 ns or
Tbddd
+ 0.4 ns
2,3
Tbedd
+ 0.2 ns or
Tbddd
+ 0.2 ns
3,4
Taod
tag_data_h
,
tag_data_par_h
,
tag_valid_h
Output delay
Tdd
+ 0.4 ns
2
Tdd
+ 0.2 ns
4
Taod
data_ram_oe_h
,
data_ram_we_h
,
1
tag_ram_oe_h
,
tag_ram_we_h
1
Output hold
Tmdd
Tmdd
5
Taoh
tag_data_h
,
tag_data_par_h
,
tag_valid_h
Output hold
Tmdd
Tmdd
5
Taoh
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