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參數(shù)資料
| 型號： | ADS7815UG4 |
| 廠商： | Texas Instruments |
| 文件頁數(shù)： | 9/16頁 |
| 文件大小： | 0K |
| 描述： | IC 16BIT 250KHZ ADC CONV 28-SOIC |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Basics |
| 標準包裝： | 20 |
| 位數(shù)： | 16 |
| 采樣率（每秒）： | 250k |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 功率耗散（最大）： | 250mW |
| 電壓電源： | 雙 ± |
| 工作溫度： | -25°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 28-SOIC（0.295"，7.50mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 28-SOIC |
| 包裝： | 管件 |
| 輸入數(shù)目和類型： | 1 個單端，雙極 |
ADS7815
2
SBAS065B
www.ti.com
ABSOLUTE MAXIMUM RATINGS
Analog Inputs: VIN ................................................................................ ±VS
REF ............................................ GND –0.3V to +VS +0.3V
CAP ............................................... Indefinite Short to GND
Momentary Short to +VS
+VS ......................................................................................................... 7V
–VS ...................................................................................................... –7V
Digital Inputs ...................................................... GND –0.3V to +VS +0.3V
Maximum Junction Temperature ................................................... +165
°C
Internal Power Dissipation ............................................................. 825mW
Lead Temperature (soldering, 10s) ............................................... +300
°C
PACKAGE
TEMPERATURE
PRODUCT
PACKAGE
DESIGNATOR
RANGE
ADS7815U
28-Pin SOIC
DW
–25
°C to +85°C
NOTE: (1) For the most current package and ordering information, see the
Package Option Addendum at then end of this data sheet, or see the TI website
at www.ti.com.
PACKAGE/ORDERING INFORMATION(1)
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
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