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參數(shù)資料
| 型號： | ADG792GBCPZ-REEL |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 24/24頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC MUX/DEMUX TRIPLE 4X1 24LFCSP |
| 產(chǎn)品變化通告： | ADG79xx Discontinuance Notice 17/Aug/2010 |
| 標(biāo)準包裝： | 1 |
| 功能： | 多路復(fù)用器/多路分解器 |
| 電路： | 3 x 4:1 |
| 導(dǎo)通狀態(tài)電阻： | 4 歐姆 |
| 電壓電源： | 單電源 |
| 電壓 - 電源，單路/雙路(±)： | 3V，5V |
| 電流 - 電源： | 1nA |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 24-VFQFN 裸露焊盤，CSP |
| 供應(yīng)商設(shè)備封裝： | 24-LFCSP-VQ（4x4） |
| 包裝： | 標(biāo)準包裝 |
| 產(chǎn)品目錄頁面： | 800 (CN2011-ZH PDF) |
| 其它名稱： | ADG792GBCPZ-REELDKR |
ADG792A/ADG792G
Rev. 0 | Page 9 of 24
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 4.
Parameter
Rating
VDD to GND
0.3 V to +6 V
Analog, Digital Inputs
0.3 V to VDD + 0.3 V or 30 mA,
whichever occurs first
Continuous Current, S or D Pins
100 mA
Peak Current, S or D Pins
300 mA (pulsed at 1 ms, 10%
duty cycle max)
Operating Temperature Range
Industrial (B Version)
40°C to +85°C
Storage Temperature Range
65°C to +150°C
Junction Temperature
150°C
θJA Thermal Impedance
24-Lead LFCSP
30°C/W
Lead Temperature, Soldering
(10 sec)
300°C
IR Reflow, Peak Temperature
(<20 sec)
260°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Only one absolute maximum rating can be applied at any
one time.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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