參數(shù)資料
型號: AD9753ASTZRL
廠商: Analog Devices Inc
文件頁數(shù): 24/28頁
文件大小: 0K
描述: IC DAC 12BIT 300MSPS 48LQFP
產(chǎn)品培訓(xùn)模塊: Data Converter Fundamentals
DAC Architectures
標(biāo)準(zhǔn)包裝: 2,000
系列: TxDAC+®
設(shè)置時間: 11ns
位數(shù): 12
數(shù)據(jù)接口: 并聯(lián)
轉(zhuǎn)換器數(shù)目: 1
電壓電源: 模擬和數(shù)字
功率耗散(最大): 165mW
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 48-LQFP
供應(yīng)商設(shè)備封裝: 48-LQFP(7x7)
包裝: 帶卷 (TR)
輸出數(shù)目和類型: 2 電流,單極;2 電流,雙極
采樣率(每秒): 300M
配用: AD9753-EB-ND - BOARD EVAL FOR AD9753
REV. B
AD9753
–5–
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD9753 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
PORT 1
DATA X
DATA Y
tH
tS
tLPW
tPD
DATA X
DATA Y
tPD
PORT 2
IOUTA OR IOUTB
INPUT CLK
(PLL ENABLED)
DATA IN
Figure 1. I/O Timing
ORDERING GUIDE
Temperature
Package
Model
Range
Description
Option
AD9753AST
–40
°C to +85°C 48-Lead LQFP ST-48
AD9753ASTRL –40
°C to +85°C 48-Lead LQFP ST-48
AD9753-EB
Evaluation
Board
THERMAL CHARACTERISTIC
Thermal Resistance
48-Lead LQFP
JA = 91
°C/W
ABSOLUTE MAXIMUM RATINGS
*
Parameter
With Respect to
Min
Max
Unit
AVDD, DVDD, CLKVDD, PLLVDD
ACOM, DCOM, CLKCOM, PLLCOM
–0.3
+3.9
V
AVDD, DVDD, CLKVDD, PLLVDD
–3.9
+3.9
V
ACOM, DCOM, CLKCOM, PLLCOM
–0.3
+0.3
V
REFIO, REFLO, FSADJ
ACOM
–0.3
AVDD + 0.3
V
IOUTA, IOUTB
ACOM
–1.0
AVDD + 0.3
V
Digital Data Inputs (DB13 to DB0)
DCOM
–0.3
DVDD + 0.3
V
CLK+/CLK–, PLLLOCK
CLKCOM
–0.3
CLKVDD + 0.3
V
DIV0, DIV1, RESET
CLKCOM
–0.3
CLKVDD + 0.3
V
LPF
PLLCOM
–0.3
PLLVDD + 0.3
V
Junction Temperature
150
°C
Storage Temperature
–65
+150
°C
Lead Temperature (10 sec)
300
°C
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device
at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum ratings for extended
periods may affect device reliability.
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