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參數(shù)資料
| 型號(hào)： | AD760AQ |
| 廠商： | Analog Devices Inc |
| 文件頁(yè)數(shù)： | 6/12頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC DAC 16BIT W/AMP SRL 28-CDIP |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Fundamentals DAC Architectures |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | DACPORT® |
| 設(shè)置時(shí)間： | 6µs |
| 位數(shù)： | 16 |
| 數(shù)據(jù)接口： | 串行，并聯(lián) |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 電壓電源： | 雙 ± |
| 功率耗散（最大）： | 725mW |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 通孔 |
| 封裝/外殼： | 28-CDIP（0.600"，15.24mm） |
| 供應(yīng)商設(shè)備封裝： | 28-CDIP |
| 包裝： | 管件 |
| 輸出數(shù)目和類型： | 2 電壓，單極；2 電壓，雙極 |
| 采樣率（每秒）： | 167k |
| 產(chǎn)品目錄頁(yè)面： | 781 (CN2011-ZH PDF) |
AD760
REV. A
–3–
NOTES
1For 18-bit resolution, 1 LSB = 0.00038% of FSR. For 16-bit resolution, 1 LSB = 0.0015% of FSR. For 14-bit resolution, 1 LSB = 0.006% of FSR. FSR stands for
full-scale range and is 10 V in unipolar mode and 20 V in bipolar mode.
2Characteristics are guaranteed at V
OUT Pin (23).
3T
CAL is the calibration temperature.
4Gain Error is measured with a fixed 50
resistor as shown in Figure 5a and Figure 6a.
5Gain Error and gain drift are measured with the internal reference. The internal reference is the main contributor to the gain drift. If lower drift is required, the
AD760 can be used with a precision external reference such as the AD587, AD586 or AD688.
6DAC Gain Error is measured without the on-chip voltage reference. It represents the performance that can be obtained with an external precision reference.
7External current is defined as the current available in addition to that supplied to REF IN and SPAN/BIPOLAR OFFSET on the AD760.
8Operation on ±12 V supplies is possible using an external reference such as the AD586 and reducing the output range. Refer to the Internal/External Reference
section.
Specifications subject to change without notice.
AC PERFORMANCE CHARACTERISTICS
Parameter
Limit
Units
Test Conditions/Comments
Output Settling Time
13
s max
20 V Step, TA = +25°C
(Time to +0.0008% FS, with
8
s typ
20 V Step, TA = +25°C
2 k , 1000 pF Load)
10
s typ
20 V Step
6
s typ
10 V Step, TA = +25°C
8
s typ
10 V Step
2.5
s typ
1 LSB Step
MUXOUT Recovery Time
Recovery time is referenced to the rising edge of CALOK,
(Time to +0.0008% FS, with
when MUXOUT switches from MUXIN to VOUT.
100 pF Load)
MUXIN = VOUT prior to calibration.
2
s typ
MUXIN, VOUT = –10 V to +10 V
Total Harmonic Distortion + Noise
A, S Grade
0.005
% max
0 dB, 1001 Hz. Sample Rate = 100 kHz. TA = +25°C
A, S Grade
0.03
% max
–20 dB, 1001 Hz. Sample Rate = 100 kHz. TA = +25°C
A, S Grade
3.0
% max
–60 dB, 1001 Hz. Sample Rate = 100 kHz. TA = +25°C
Signal-to-Noise Ratio
94
dB min
TA = +25°C, byte load
Digital-to-Analog Glitch Impulse
15
nV-s typ
DAC alternately loaded with 8000H and 7FFFH
MUXOUT Glitch Impulse
30
nV-s typ
100 pF Load. MUXIN = VOUT = negative full scale
Digital Feedthrough
2
nV-s typ
DAC alternately loaded with 0000H and FFFFH. CS high
Output Noise Voltage Density (1 kHz–1 MHz)
120
nV/ Hz typ
Measured at VOUT, 20 V span, excludes internal reference
Reference Noise (1 kHz–1 MHz)
125
nV/ Hz typ
Measured at REF OUT
Specifications are subject to change without notice.
With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise
Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested. (TMIN < TA
< TMAX, VCC = +15 V, VEE = –15 V, VLL = +5 V, tested at VOUT except where noted.)
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