參數(shù)資料
型號: AD5243EVAL
廠商: Analog Devices Inc
文件頁數(shù): 4/20頁
文件大?。?/td> 0K
描述: BOARD EVAL FOR AD5243
標準包裝: 1
主要目的: 數(shù)字電位器
已用 IC / 零件: AD5243
已供物品:
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AD5243/AD5248
Data Sheet
Rev. B | Page 12 of 20
TEST CIRCUITS
Figure 30 through Figure 36 illustrate the test circuits that define the test conditions used in the product specification tables (see Table 1
04109-0-003
VMS
A
W
B
DUT
V+
V+ = VDD
1LSB = V+/2N
Figure 30. Test Circuit for Potentiometer Divider Nonlinearity Error
(INL, DNL)
04109-0-004
NO CONNECT
IW
VMS
A
W
B
DUT
Figure 31. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation: R-INL, R-DNL)
04109-0-005
VMS2
VMS1
VW
A
W
B
DUT
IW = VDD/RNOMINAL
RW = [VMS1 – VMS2]/IW
Figure 32. Test Circuit for Wiper Resistance
04109-0-006
V
MS%
DUT
(
)
A
W
B
V+
V
DD%
V
MS
V
DD
V
DD
VA
VMS
V+ = VDD ± 10%
PSRR (dB) = 20 LOG
PSS (%/%) =
Figure 33. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
04109-0-009
+15V
–15V
W
A
2.5V
B
VOUT
OFFSET
GND
DUT
AD8610
VIN
Figure 34. Test Circuit for Gain vs. Frequency
04109-0-010
W
B
VSS TO VDD
DUT
ISW
CODE = 0x00
RSW =
0.1V
ISW
0.1V
Figure 35. Test Circuit for Incremental On Resistance
W
B
VCM
ICM
A
NC
GND
NC
VDD
DUT
NC = NO CONNECT
04109-0-011
Figure 36. Test Circuit for Common-Mode Leakage Current
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