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參數(shù)資料
| 型號： | A5303SLETR-T |
| 廠商： | Allegro Microsystems Inc |
| 文件頁數(shù)： | 15/15頁 |
| 文件大小： | 0K |
| 描述： | IC SMOKE DETECTOR PHOTO 20TSSOP |
| 特色產(chǎn)品： | A5303 Standard 3V Smoke Detector IC |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 類型： | 煙霧探測器 |
| 輸入類型： | 光電 |
| 輸出類型： | 電壓 |
| 電流 - 電源： | 300µA |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 20-TSSOP（0.173"，4.40mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 20-TSSOP |
| 包裝： | 標(biāo)準(zhǔn)包裝 |
| 其它名稱： | 620-1346-6 |
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
9
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
local alarm, the LED blinks every 0.5 s (nominally), but during a
remote alarm, the LED is disabled and does not blink.
The degraded-chamber test occurs periodically (nominally every
45.9 min). During this test, the gain of the photoamplifier is
switched to the high (supervisory) level, set by C1. The device
expects that the photodiode will receive enough background
reflections in the chamber to cause an alarm condition. If a faulty,
dirty, or obstructed chamber prevents this during a test, the test
period decreases to 43 s. After two consecutive failed tests, the
device signals a degraded chamber condition to the sound IC.
It also chirps the horn and pulses the LED three times every
43 seconds. The condition is resolved when the chamber is either
cleared or cleaned, and the test period then reverts to (nominally)
45.9 min.
The low-battery test also occurs periodically (also nominally
every 45.9 min, but at a different time than the degraded-chamber
test). During this test a resistive divider off VDD is compared to
an internal band-gap reference. If VDD is below the threshold, the
device signals a low battery condition to the sound IC and the
test period decreases to 43 s. It also chirps the horn and pulses the
LED once every 43 seconds. The condition is resolved when the
battery is replaced and the test period then reverts to (nominally)
45.9 min.
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