Revision 13 2-23 Table 2-23 Schmitt Trigger Input Hysteresis Hysteresis Voltage Value (typ.) for Schmitt Mode" />
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    參數(shù)資料
    型號(hào): A3PE600-1PQG208
    廠商: Microsemi SoC
    文件頁數(shù): 94/162頁
    文件大?。?/td> 0K
    描述: IC FPGA 600000 GATES 208-PQFP
    標(biāo)準(zhǔn)包裝: 24
    系列: ProASIC3E
    RAM 位總計(jì): 110592
    輸入/輸出數(shù): 147
    門數(shù): 600000
    電源電壓: 1.425 V ~ 1.575 V
    安裝類型: 表面貼裝
    工作溫度: 0°C ~ 70°C
    封裝/外殼: 208-BFQFP
    供應(yīng)商設(shè)備封裝: 208-PQFP(28x28)
    ProASIC3E Flash Family FPGAs
    Revision 13
    2-23
    Table 2-23 Schmitt Trigger Input Hysteresis
    Hysteresis Voltage Value (typ.) for Schmitt Mode Input Buffers
    Input Buffer Configuration
    Hysteresis Value (typ.)
    3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode)
    240 mV
    2.5 V LVCMOS (Schmitt trigger mode)
    140 mV
    1.8 V LVCMOS (Schmitt trigger mode)
    80 mV
    1.5 V LVCMOS (Schmitt trigger mode)
    60 mV
    Table 2-24 I/O Input Rise Time, Fall Time, and Related I/O Reliability*
    Input Buffer
    Input Rise/Fall Time
    (min.)
    Input Rise/Fall Time (max.)
    Reliability
    LVTTL/LVCMOS
    (Schmitt trigger disabled)
    No requirement
    10 ns *
    20 years
    (110°C)
    LVTTL/LVCMOS
    (Schmitt trigger enabled)
    No requirement
    No requirement, but input noise
    voltage
    cannot
    exceed
    Schmitt
    hysteresis.
    20 years
    (110°C)
    HSTL/SSTL/GTL
    No requirement
    10 ns *
    10 years
    (100°C)
    LVDS/B-LVDS/M-LVDS/
    LVPECL
    No requirement
    10 ns *
    10 years
    (100°C)
    Note: *For clock signals and similar edge-generating signals, refer to the "ProASIC3/E SSO and Pin
    Placement Guidelines" chapter of the ProASIC3E FPGA Fabric User’s Guide. The maximum input
    rise/fall time is related to the noise induced into the input buffer trace. If the noise is low, then the
    rise time and fall time of input buffers can be increased beyond the maximum value. The longer the
    rise/fall times, the more susceptible the input signal is to the board noise. Microsemi recommends
    signal integrity evaluation/characterization of the system to ensure that there is no excessive noise
    coupling into input signals.
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