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參數(shù)資料
| 型號： | 935260062118 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 通信及網(wǎng)絡 |
| 英文描述： | SPECIALTY TELECOM CIRCUIT, XMA |
| 封裝： | 11.75 X 7.55 MM, 0.45 MM HEIGHT, MODULE |
| 文件頁數(shù)： | 11/22頁 |
| 文件大小： | 161K |
| 代理商： | 935260062118 |
Specifications of the HT2 MOA3 S20
Rev. 1.1
1997-08-19
Ht2moa3.doc/HS
Page 19 of 22
7 Characterisation and Test of the Final Transponder
7.1 Characterisation of the Transponder
The parameters recommended to be characterised for the transponder are:
Parameter
Comment
Resonant frequency
fres
Transponder does not modulate
Resonant frequency @ Tamb = 22°C, @ BTH
Threshold value
BTH
Start of modulation
Threshold value for READ
BRD
Command READ_PAGE OK
Threshold value for WRITE
BWR
Command WRITE_PAGE OK
For the measurement of these parameters we recommend to use the test equipment available from
SCEMTEC, Marienheide-Rodt, Germany (Transponder Measurement System STM-1).
This device also supports functional testing (besides parameter testing). Therefore it can also be
used as production test equipment for the final transponder test. For further information please
contact Scemtec GmbH.
7.2 Final Test of the Transponder
In addition to the equipment described in the previous chapter Philips Semiconductors offers a
device for a final functional test of transponders, the HITAG
TM Test System HT OT490.
Parameter tests are not supportet by this device.
Basic flow for production and test:
1. Assembly of transponders
2. Functional test and final test of the EEPROM
Since the Keys and Logdata are changed during final test the Configuration and
personalization must take place after the final test. The final test is disabled (not reversible)
by setting the Tag-test mode bit to 0.
For the final test of transponders we recommend to use the
HITAG
TM Test System HT OT490 of Philips Semiconductors or the
Transponder Measurement System STM-1 of Scemtec.
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