參數(shù)資料
型號(hào)： 933646820602
廠商： NXP SEMICONDUCTORS
元件分類： 總線收發(fā)器
英文描述： F/FAST SERIES, OCTAL 1-BIT DRIVER, TRUE OUTPUT, PDIP20
封裝： 0.300 INCH, PLASTIC, MS-001, SOT-146-1, DIP-20
文件頁數(shù)： 10/13頁
文件大?。?/td> 146K
代理商： 933646820602
Philips Semiconductors
Product data
74F373/74F374
Latch/flip-flop
2002 Nov 20
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS1
MIN
TYP2
MAX
UNIT
VO
HIGH level output voltage
VCC = MIN, VIL = MAX,
±10%VCC
2.4
V
VOH
HIGH-level output voltage
CC
,
IL
,
VIH = MIN, IOH = MAX
±5%VCC
2.7
3.4
V
VO
LOW level output voltage
VCC = MIN, VIL = MAX,
±10%VCC
0.35
0.50
V
VOL
LOW-level output voltage
CC
,
IL
,
VIH = MIN, IOL = MAX
±5%VCC
0.35
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0 V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7 V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5 V
–0.6
mA
IOZH
Off-state output current, high-level voltage applied
VCC = MAX, VO = 2.7 V
50
A
IOZL
Off-state output current, low-level voltage applied
VCC = MAX, VO = 0.5 V
–50
A
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
74F373
VCC = MAX
35
60
mA
74F374
57
86
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5 V, Tamb = 25 °C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
Tamb = +25 °C
Tamb = 0 °C to +70 °C
SYMBOL
PARAMETER
TEST
VCC = +5.0 V
VCC = +5.0 V ± 10%
UNIT
CONDITION
CL = 50 pF; RL = 500
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
Dn to Qn
Waveform 3
3.0
2.0
5.3
3.7
7.0
5.0
3.0
2.0
8.0
6.0
ns
tPLH
tPHL
Propagation delay
E to Qn
74F373
Waveform 2
5.0
3.0
9.0
4.0
11.5
7.0
5.0
3.0
12.0
8.0
ns
tPZH
tPZL
Output enable time
to HIGH or LOW level
Waveform 6
Waveform 7
2.0
5.0
5.6
11.0
7.5
2.0
11.5
8.5
ns
tPHZ
tPLZ
Output disable time
from HIGH or LOW level
Waveform 6
Waveform 7
2.0
4.5
3.8
6.5
5.0
2.0
7.0
6.0
ns
fmax
Maximum clock frequency
Waveform 1
150
165
140
ns
tPLH
tPHL
Propagation delay
CP to Qn
74F374
Waveform 1
3.5
5.0
7.5
3.0
8.5
ns
tPZH
tPZL
Output enable time
to HIGH or LOW level
Waveform 6
Waveform 7
2.0
9.0
5.3
11.0
7.5
2.0
12.0
8.5
ns
tPHZ
tPLZ
Output disable time
from HIGH or LOW level
Waveform 6
Waveform 7
2.0
5.3
4.3
6.0
5.5
2.0
7.0
6.5
ns
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