參數(shù)資料
型號(hào)： 74LVC86AN
廠商： NXP SEMICONDUCTORS
元件分類： 通用總線功能
英文描述： Quad 2-input exclusive OR gate
中文描述： LVC/LCX/Z SERIES, QUAD 2-INPUT XOR GATE, PDIP14
文件頁(yè)數(shù)： 3/10頁(yè)
文件大?。?/td> 102K
代理商： 74LVC86AN
Philips Semiconductors
Product specification
74LVC86A
Quad 2-input exclusive OR gate
1998 Apr 28
3
LOGIC SYMBOL
4B
4A
SV00480
1A
1B
2A
2B
3B
3A
1Y
2Y
3Y
4Y
1
2
4
5
13
12
10
9
3
6
11
8
LOGIC DIAGRAM (ONE GATE)
SV00478
A
B
Y
FUNCTION TABLE
INPUTS
OUTPUTS
nA
nB
nY
L
L
L
H
L
H
H
L
H
H
H
L
NOTES:
H =HIGH voltage level
L
=LOW voltage level
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
MAX
V
CC
DC supply voltage (for max. speed performance)
2.7
3.6
V
DC supply voltage (for low-voltage applications)
1.2
3.6
V
I
DC Input voltage range
0
5.5
V
V
O
DC output voltage range
0
V
CC
V
T
amb
Operating ambient temperature range in free-air
–40
+85
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
1
Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
DC supply voltage (for max. speed
performance)
–0.5 to +6.5
V
I
IK
V
I
DC input diode current
V
I
Note 2
0
–50
mA
DC input voltage
–0.5 to +5.5
V
I
OK
DC output diode current
V
O
V
CC
or V
O
0
50
mA
V
O
DC output voltage
Note 2
–0.5 to V
CC
+ 0.5
V
I
O
DC output source or sink current
V
O
= 0 to V
CC
50
mA
I
GND
, I
CC
DC V
CC
or GND current
100
mA
T
stg
Storage temperature range
–65 to +150
°
C
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
P
TOT
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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