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參數(shù)資料
| 型號： | 74F835 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | 8-bit shift register with 2:1 mux-in, latched “B” inputs, and serial out |
| 中文描述： | 8位的移位寄存器的2:1多路復用器，在鎖定的“B”的投入，串行輸出， |
| 文件頁數(shù)： | 4/6頁 |
| 文件大?。?/td> | 61K |
| 代理商： | 74F835 |
Philips Semiconductors
Product specification
74F835
8-bit shift register with 2:1 mux-in,
latched “B” inputs, and serial out
1990 Jan 08
4
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
T
stg
Supply voltage
–0.5 to +7.0
V
Input voltage
–0.5 to +7.0
V
Input current
–30 to +5
mA
Voltage applied to output in High output state
–0.5 to V
CC
40
V
Current applied to output in Low output state
mA
Operating free-air temperature range
0 to +70
°
C
°
C
Storage temperature range
–65 to +150
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
V
IH
V
IL
I
IK
I
OH
I
OL
T
amb
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
High-level output current
–1
mA
Low-level output current
20
mA
Operating free-air temperature range
0
+70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
V
OH
High-level output voltage
V
IH
= MIN, I
OH
= MAX
±
10% V
CC
±
5% V
CC
±
10% V
CC
±
5% V
CC
2.5
V
V
CC
= MIN, V
IL
= MAX
2.7
3.4
V
V
OL
Low-level output voltage
V
IH
= MIN, I
OH
L= MAX
0.30
0.50
V
V
CC
= MIN, V
IL
= MAX
0.30
0.50
V
V
IK
I
I
I
IH
I
IL
I
OS
I
CC
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX
V
CC
= MAX
–0.73
–1.2
V
Input current at maximum input voltage
100
μ
A
μ
A
High-level input current
20
Low-level input current
Short circuit output current
3
–0.6
mA
–60
–150
mA
Supply current (total)
45
65
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
= 5V. T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other tests. In any sequence of
parameter tests, I
OS
tests should be performed last.
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