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Philips Semiconductors
Product specification
74F193
Up/down binary counter with separate up/down clocks
1995 Jul 17
5
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free-air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
T
stg
Supply voltage
–0.5 to +7.0
V
Input voltage
–0.5 to +7.0
V
Input current
–30 to +5.0
mA
Voltage applied to output in High output state
–0.5 to +V
CC
40
V
Current applied to output in Low output state
mA
°
C
°
C
Operating free-air temperature range
0 to +70
Storage temperature
–65 to +150
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
NOM
UNIT
MIN
MAX
V
CC
V
IH
V
IL
I
IK
I
OH
I
OL
T
amb
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
High-level output current
–1
mA
Low-level output current
20
mA
°
C
Operating free-air temperature range
0
+70
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
TYP
NO TAG
MAX
UNIT
V
OH
High level output voltage
High-level output voltage
V
CC
=
MIN, V
IL
=
MAX,
I
OH
= MAX, V
IH
= MIN
10%V
CC
5%V
CC
10%V
CC
5%V
CC
2.5
V
2.7
3.4
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
=
MIN, V
IL
=
MAX,
I
OL
= MAX, V
IH
= MIN
0.35
0.50
V
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum
input voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
I
IL
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
Low-level input
Low level in ut
current
CP
U
, CP
D
Others
V
CC
= MAX V = 0 5V
I
= 0.5V
–1.8
mA
–0.6
mA
I
OS
I
CC
Short-circuit output current
NO TAG
Supply current (total)
4
V
CC
= MAX
V
CC
= MAX
–60
–150
mA
32
50
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
tests should be performed last.
4. Measure I
CC
with parallel load and Master reset inputs grounded, all other inputs at 4.5V and all outputs open.