參數(shù)資料
型號: 74ALVCH16825
廠商: NXP Semiconductors N.V.
英文描述: Automotive Catalog Quadruple Positive-NAND Gates With Schmitt-Trigger Inputs 14-TSSOP -40 to 125
中文描述: 18位緩沖器/驅(qū)動器三態(tài)
文件頁數(shù): 4/10頁
文件大小: 73K
代理商: 74ALVCH16825
Philips Semiconductors
Product specification
74ALVCH16825
18-bit buffer/driver (3-State)
1998 Jul 27
4
LOGIC DIAGRAM
nY
n
TO 8 OTHER CHANNELS
nA
n
nOE2
nOE1
SH00140
BUS HOLD CIRCUIT
To internal circuit
V
CC
Data Input
SW00044
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
UNIT
V
CC
DC supply voltage 2.5V range (for max. speed
performance @ 30 pF output load)
2.3
2.7
V
DC supply voltage 3.3V range (for max. speed
performance @ 50 pF output load)
3.0
3.6
V
I
DC Input voltage range
0
V
CC
V
V
O
DC output voltage range
0
V
CC
V
T
amb
Operating free-air temperature range
–40
+85
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 2.3 to 3.0V
V
CC
= 3.0 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
DC supply voltage
–0.5 to +4.6
V
DC input diode current
V
I
For control pins
2
0
–50
mA
V
I
DC input voltage
DC in ut voltage
–0.5 to +4.6
V
For data inputs
2
–0.5 to V
CC
+0.5
50
I
OK
V
O
I
O
DC output diode current
V
O
Note 2
V
CC
or V
O
0
mA
DC output voltage
–0.5 to V
CC
+0.5
50
V
DC output source or sink current
V
O
= 0 to V
CC
mA
I
GND
, I
CC
T
stg
DC V
CC
or GND current
Storage temperature range
100
mA
–65 to +150
°
C
P
TOT
Power dissipation per package
–plastic medium-shrink (SSOP)
–plastic thin-medium-shrink (TSSOP)
For temperature range: –40 to +125
°
C
above +55
°
C derate linearly with 11.3 mW/K
above +55
°
C derate linearly with 8 mW/K
850
600
mW
NOTE:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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