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參數資料
| 型號： | 74ACQ657SPC |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Quiet Series⑩ Octal Bidirectional Transceiver with 8-Bit Parity Generator/Checker and 3-STATE Outputs |
| 中文描述： | AC SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, PDIP24 |
| 封裝： | 0.300 INCH, SLIM, PLASTIC, MS-001, DIP-24 |
| 文件頁數： | 8/10頁 |
| 文件大小： | 96K |
| 代理商： | 74ACQ657SPC |
www.fairchildsemi.com
8
7
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500
.
2. Deskew the HFS generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set the HFS generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and effect the results of the measure-
ment.
5. Set the HFS generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.
FIGURE 1. Quiet Output Noise Voltage Waveforms
Note 19:
V
OHV
and V
OLP
are measured with respect to ground reference.
Note 20:
Input pulses have the following characteristics: f
=
1 MHz,
t
r
=
3 ns, t
f
=
3 ns, skew
<
150 ps.
V
OLP
/V
OLV
and V
OHP
/V
OHV
:
Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50
coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
Measure V
OLP
and V
OLV
on the quiet output during the
worst case transition for active and enable. Measure
V
OHP
and V
OHV
on the quiet output during the worst
case transition.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
ILD
and V
IHD
:
Monitor one of the switching outputs using a 50
coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
First increase the input LOW voltage level, V
IL
, until the
output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
Next decrease the input HIGH voltage level, V
IH
, until
the output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
FIGURE 2. Simultaneous Switching Test Circuit
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相關代理商/技術參數 |
參數描述 |
|---|---|
| 74ACT00 | 功能描述:NAND Gate IC 4 Channel Die 制造商:fairchild/micross components 系列:74ACT 包裝:托盤 零件狀態(tài):有效 邏輯類型:與非門 電路數:4 輸入數:2 特性:- 電壓 - 電源:4.5 V ~ 5.5 V 電流 - 靜態(tài)（最大值）:2μA 電流 - 輸出高，低:24mA，24mA 邏輯電平 - 低:0.8V 邏輯電平 - 高:2V 不同 V，最大 CL 時的最大傳播延遲:9ns @ 5V，- 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 供應商器件封裝:模具 封裝/外殼:模具 標準包裝:25 |
| 74ACT00B | 功能描述:邏輯門 Quad 2-Input NAND RoHS:否 制造商:Texas Instruments 產品:OR 邏輯系列:LVC 柵極數量:2 線路數量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| 74ACT00D | 制造商:Texas Instruments 功能描述: 制造商:undefined 功能描述: |
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