參數(shù)資料
型號: XR88C681CJ
廠商: EXAR CORP
元件分類: 微控制器/微處理器
英文描述: CMOS DUAL CHANNEL UART (DUART)
中文描述: 2 CHANNEL(S), 1M bps, SERIAL COMM CONTROLLER, PQCC44
封裝: PLASTIC, LCC-44
文件頁數(shù): 10/99頁
文件大?。?/td> 1913K
代理商: XR88C681CJ
XR88C681
AC ELECTRICAL CHARACTERISTICS
1, 2, 3
(CONT’D)
Test Conditions:
J >
" ;
J 6;
6K %% (% %'(+($
Symbol
Parameter
Min.
Typ.
Max.
Unit
Conditions
Clock Timing (
Figure 56
) (Cont’d.)
.( 2! '3
8(- 9 ( #,
.( 2! '3
E'&
5 $ 5 2! 8(-
9 (
5 $ 5 2!
E'&
/5
5
%
>1>
8I
5
=
%
+
5
/
8I
8I
Transmitter Timing (
Figure 57
)
5
5 & 5
2! 9
5 & 5
# 9
5 ( 5
2! 8(-
5 8$ ( + 5
2! 8(-
16
%
6
%
5
<
%
58
%
Notes
1.
Parameters are valid over the specified temperature and operating supply ranges. Typical values are 25 C, V
CC
= 5V and typical
processing parameters.
2.
All voltages are referenced to ground (GND). For testing, input signal levels are 0.4V and 2.4V with a transition time of 20ns
maximum. All time measurements are referenced at input voltages of 0.8V and 2.0V as appropriate. See Figure 50.
3.
AC test conditions for outputs: CL = 50pF, RL = 2.7k to V
CC
.
4.
If CS is used as the strobing input, this parameter defines the minimum high time between CSs.
5.
Consecutive write operations to the same register require at least three edges of the X1 clock between writes.
6.
Thisspecificationimposesa6MHzmaximum68000clockfrequencyifareadorwritecyclefollowsimmediatelyaftertheprevious
read or write cycle. A higher 68000 clock can be used if this is not the case.
7.
This specification imposes a lower bound on CS and IACK low, guaranteeing that they will be low for at least one CLK period.
8.
Theminimumhightimemustbeatleast1.5timestheX1/CLKperiodandtheminimumlowtimemustbeatleastequaltotheX1/CLK
period if either channel’s Receiver is operating in external 1X clock mode.
Specifications are subject to change without notice
ABSOLUTE MAXIMUM RATINGS
1
& ;-
-
;-% (
%' 0$
>;
/6
6
6; A>;
1.
StressesabovethoselistedundertheAbsoluteMaximumRatingsmaycausepermanentdamagetothedevice. Thisisastressrat-
ingonly,andfunctionaloperationofthedeviceattheseoranyotherconditionsabovethoseindicatedinthe“ElectricalCharacteris-
tics” section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
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