參數(shù)資料
型號(hào): WPS512K8LC-25RJM
元件分類: SRAM
英文描述: 512K X 8 STANDARD SRAM, 25 ns, PDSO36
封裝: PLASTIC, SOJ-36
文件頁數(shù): 3/5頁
文件大?。?/td> 89K
代理商: WPS512K8LC-25RJM
3
White Electronic Designs Corporation Phoenix, AZ (602) 437-1520
AC CHARACTERISTICS
(VCC = 5.0V, VSS = 0V, TA = -55
°C to +125°C)
WPS512K8X-XRJX
AC CHARACTERISTICS
(VCC = 5.0V, TA = -55
°C to +125°C)
Parameter
Symbol
-15*
-20
-25
Units
Read Cycle
Min
Max
Min
Max
Min
Max
Read Cycle Time
tRC
15
20
25
ns
Address Access Time
tAA
15
20
25
ns
Output Hold from Address Change
tOH
00
0
ns
Chip Select Access Time
tACS
15
20
25
ns
Output Enable to Output Valid
tOE
810
12
ns
Chip Select to Output in Low Z
tCLZ1
33
3
ns
Output Enable to Output in Low Z
tOLZ1
00
0
ns
Chip Disable to Output in High Z
tCHZ1
78
10
ns
Output Disable to Output in High Z
tOHZ1
78
10
ns
* 15ns not available in the lower power option.
1. This parameter is guaranteed by design but not tested.
Parameter
Symbol
-15*
-20
-25
Units
Write Cycle
Min
Max
Min
Max
Min
Max
Write Cycle Time
tWC
15
20
25
ns
Chip Select to End of Write
tCW
12
13
15
ns
Address Valid to End of Write
tAW
12
13
15
ns
Data Valid to End of Write
tDW
8910
ns
Write Pulse Width
tWP
12
13
15
ns
Address Setup Time
tAS
00
0
ns
Address Hold Time
tAH
00
0
ns
Output Active from End of Write
tOW1
00
0
ns
Write Enable to Output in High Z
tWHZ1
88
10
ns
Data Hold Time
tDH
00
0
ns
* 15ns not available in the lower power option.
1. This parameter is guaranteed by design but not tested.
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75
.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
1.5V
(Bipolar Supply)
Z
Current Source
OH
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