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參數(shù)資料
| 型號(hào)： | WF8M32-150G4DM5 |
| 廠商： | WHITE ELECTRONIC DESIGNS CORP |
| 元件分類： | PROM |
| 英文描述： | 8M X 32 FLASH 5V PROM MODULE, 150 ns, CQFP68 |
| 封裝： | 40 X 40 MM, 5.20 MM HEIGHT, HERMETIC SEALED, CERAMIC, QFP-68 |
| 文件頁(yè)數(shù)： | 5/10頁(yè) |
| 文件大?。?/td> | 350K |
| 代理商： | WF8M32-150G4DM5 |
4
White Electronic Designs Corporation (602) 437-1520 www.wedc.com
White Electronic Designs
WF8M32-XG4DX5
October 1999
Rev. 3
ADVANCED
White Electronic Designs Corp. reserves the right to change products or specications without notice.
FIGURE 3 – RESET TIMING DIAGRAM
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS – CS# CONTROLLED
VCC = 3.3V, VSS = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Symbol
-100
-120
-150
Unit
Min
Max
Min
Max
Min
Max
Write Cycle Time
tAVAV
tWC
100
120
150
ns
Write Enable Setup Time
tWLEL
tWS
000
ns
Chip Select Pulse Width
tELEH
tCP
50
ns
Address Setup Time
tAVEL
tAS
000
ns
Data Setup Time
tDVEH
tDS
50
ns
Data Hold Time
tEHDX
tDH
000
ns
Address Hold Time
tELAX
tAH
50
ns
Chip Select Pulse Width High
tEHEL
tCPH
20
ns
Duration of Byte Programming Operation (1)
tWHWH1
300
s
Sector Erase Time (2)
tWHWH2
15
sec
Read Recovery Time (2)
tGHEL
000
s
Chip Programming Time
100
sec
Chip Erase Time (3)
480
sec
Output Enable Hold Time (4)
tOEH
10
ns
NOTES:
1. Typical value for tWHWH1 is 7s.
2. Typical value for tWHWH2 is 1sec.
3. Typical value for Chip Erase Time is 32sec.
4. For Toggle and Data Polling.
FIGURE 2 – AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 .
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
≈ 1.5V
(Bipolar Supply)
Z
Current Source
OH
RESET#
tRP
tReady
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