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| 型號(hào)： | VS-750 |
| 廠商： | Electronic Theatre Controls, Inc. |
| 英文描述： | DUAL FREQUENCY VCSO |
| 中文描述： | 雙頻才能開發(fā)出復(fù)雜 |
| 文件頁數(shù)： | 6/7頁 |
| 文件大?。?/td> | 158K |
| 代理商： | VS-750 |
VS-750 Voltage Controlled SAW Oscillator
Preliminary Data Sheet
Vectron International, 267 Lowell Rd, Hudson NH 03051-4916
Tel: 1-88-VECTRON-1 Website: www.vectron.com
Page 6 of 7
Rev: 03Mar05
The device has been qualified to meet the JEDEC
standard for Pb-Free assembly. The temperatures
and time intervals listed are based on the Pb-Free
small body requirements. The temperatures refer to
the topside of the package, measured on the
package body surface. The VS-750 device is
hermetically sealed so an aqueous wash is not an
issue.
25
217
200
150
260
t
S
t
AMB-P
T
Time (sec)
t
L
t
P
R
UP
R
DN
Reliability
VI qualification includes aging at various extreme temperatures, shock and vibration, temperature cycling, and
IR reflow simulation. The VS-750 family is capable of meeting the following qualification tests:
Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross and Fine Leak
Resistance to Solvents
Handling Precautions
Although ESD protection circuitry has been designed into the VS-750 proper precautions should be taken when
handling and mounting. VI employs a human body model (HBM) and a charged-device model (CDM) for ESD
susceptibility testing and design protection evaluation.
ESD Ratings
Model
Minimum
Human Body Model
1500 V
Charged Device Model
1000 V
Reflow Profile (IPC/JEDEC J-STD-020C)
Parameter
Symbol
PreHeat Time
t
S
Ramp Up
R
UP
Time Above 217
o
C
t
L
Time To Peak Temperature
t
AMB-P
Time At 260
o
C
t
P
Ramp Down
R
DN
Conditions
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014
MIL-STD-883, Method 2016
Conditions
MIL-STD 883, Method 3015
JEDEC, JESD22-C101
Value
60 sec Min, 180 sec Max
3
o
C/sec Max
60 sec Min, 150 sec Max
480 sec Max
20 sec Min, 40 sec Max
6
o
C/sec Max
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