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參數(shù)資料
| 型號(hào)： | VCC1-B3D-40M000 |
| 廠商： | VECTRON INTERNATIONAL |
| 元件分類(lèi)： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 40 MHz, CMOS OUTPUT |
| 封裝： | ROHS COMPLIANT PACKAGE-4 |
| 文件頁(yè)數(shù)： | 7/10頁(yè) |
| 文件大小： | 216K |
| 代理商： | VCC1-B3D-40M000 |
Vectron International 267 Lowell Road, Hudson, NH 03051 Tel: 1-88-VECTRON-1 http://www.vectron.com
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional operation is not
implied at these or any other conditions in excess of conditions represented in the operational sections of this datasheet.
Exposure to absolute maximum ratings for extended periods may adversely affect device reliability. Permanent damage is
also possible if E/D is applied before V
DD
.
Reliability
VI qualification includes aging at various extreme temperatures, shock and vibration, temperature cycling, and IR reflow
simulation. The VCC1 family is capable of meeting the following qualification tests:
Table 6. Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Temperature Cycle
Solderability
Gross and Fine Leak
Resistance to Solvents
Moisture Sensitivity Level
Contact Pads
Conditions
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 1010
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014
MIL-STD-883, Method 2015
MSL 1
Gold over Nickel
Table 7. ESD Ratings
Model
Minimum
1500V
1000V
Conditions
Human Body Model
Charged Device Model
MIL-STD-883, Method 3015
JESD22-C101
Although ESD protection circuitry has been designed into the VCC1 proper precautions should be taken when handling
and mounting. VI employs a human body model (HBM) and a charged device model (CDM) for ESD susceptibility testing
and design protection evaluation.
Table 8. Absolute Maximum Ratings
Parameter
Storage Temperature
Soldering Temp/Time
Symbol
TS
T
LS
Ratings
-55 to 125
260 / 20
Unit
°C
°C / sec
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