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參數(shù)資料
| 型號： | UPD44325364F5-E33-EQ2 |
| 廠商： | NEC Corp. |
| 英文描述： | 36M-BIT QDRII SRAM 4-WORD BURST OPERATION |
| 中文描述： | 36M條位推出QDRII SRAM的4個字爆發(fā)運作 |
| 文件頁數(shù)： | 26/36頁 |
| 文件大?。?/td> | 377K |
| 代理商： | UPD44325364F5-E33-EQ2 |
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26
Preliminary Data Sheet
M16784EJ1V0DS
μ
PD44325084, 44325094, 44325184, 44325364
TAP Controller State Diagram
Test-Logic-Reset
Run-Test / Idle
Select-DR-Scan
Capture-DR
Capture-IR
Shift-DR
Exit1-DR
Pause-DR
Exit2-DR
Update-DR
Update-IR
Exit2-IR
Pause-IR
Exit1-IR
Shift-IR
Select-IR-Scan
0
0
0
1
0
1
1
0
0
1
0
1
1
0
0
0
0
1
0
1
0
1
1
1
0
1
1
0
1
0
1
1
Disabling the Test Access Port
It is possible to use this device without utilizing the TAP. To disable the TAP Controller without interfering with normal
operation of the device, TCK must be tied to V
SS
to preclude mid level inputs.
TDI and TMS are designed so an undriven input will produce a response identical to the application of a logic 1, and
may be left unconnected. But they may also be tied to V
DD
through a 1 k
resistor.
TDO should be left unconnected.
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