參數(shù)資料
型號: UAA2082U
廠商: NXP SEMICONDUCTORS
元件分類: 尋呼電路
英文描述: Advanced pager receiver
中文描述: TELECOM, PAGING RECEIVER, UUC37
封裝: DIE-28
文件頁數(shù): 25/40頁
文件大?。?/td> 457K
代理商: UAA2082U
1996 Jan 15
25
Philips Semiconductors
Product specification
Advanced pager receiver
UAA2082
Table 6
AC test conditions; notes 1 and 2
Notes
1.
2.
3.
The tests are executed without load on pins TPI and TPQ.
All minimum and maximum values correspond to a bit error rate (BER)
3
100
in the wanted signal (P
1
).
The BER measurement is started 5 ms (t
on(max)
) after V
RE
goes HIGH; BER is then measured for 100 bits
(BER
3
100
).
SYMBOL
α
a
PARAMETER
CONDITIONS
TEST SIGNALS
adjacent channel selectivity;
Fig.11(b)
f
2
= f
1
±
f
CS
generator 1: modulated test signal 1
generator 2: modulated test signal 2
f
2
= f
1
±
up to 3 kHz
generator 1: modulated test signal 1
generator 2: modulated test signal 2
f
2
= 100 kHz to 2 GHz
generator 1: modulated test signal 1
generator 2: modulated test signal 2
f
2
= f
1
±
f
cs
; f
3
= f
1
±
2
f
cs
generator 1: modulated test signal 1
generator 2: unmodulated
generator 3: modulated test signal 2
f
2
= f
1
±
1 MHz
generator 1: modulated test signal 1
generator 2: modulated test signal 2
deviation =
±
4.0 kHz, f
1
= f
i(RF)
±
2 kHz (f
offset(min)
)
generator 1: modulated test signal 1
deviation =
±
2.5 to
±
7 kHz; (
f
dev(min)
to
f
dev(max)
)
generator 1: modulated test signal 1
P
1
= P
i(ref)
+ 3 dB
P
2
= P
1
+
α
a(min)
α
c
co-channel rejection; Fig.11(b)
P
1
= P
i(ref)
+ 3 dB
P
2
= P
1
α
c(max)
α
sp
spurious immunity; Fig.11(b)
P
1
= P
i(ref)
+ 3 dB
P
2
= P
1
+
α
sp( min)
α
im
intermodulation immunity;
Fig.11(c)
P
1
= P
i(ref)
+ 3 dB
P
2
= P
1
+
α
im(min)
P
3
= P
2
α
bl
blocking immunity; Fig.11(b)
P
1
= P
i(ref)
+ 3 dB
P
2
= P
1
+
α
bl(min)
f
offset
frequency offset range;
Fig.11(a)
P
1
= P
i(ref)
+ 3 dB
f
dev
deviation range; Fig.11(a)
P
1
= P
i(ref)
+ 3 dB
t
on
receiver turn-on time; Fig.11(a) note 3
generator 1: modulated test signal 1
P
1
= P
i(ref)
+ 10 dB
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