參數(shù)資料
型號: UAA2082
廠商: NXP Semiconductors N.V.
英文描述: Advanced pager receiver
中文描述: 高級尋呼機接收器
文件頁數(shù): 24/40頁
文件大?。?/td> 457K
代理商: UAA2082
1996 Jan 15
24
Philips Semiconductors
Product specification
Advanced pager receiver
UAA2082
TEST INFORMATION
Tuning procedure for AC tests
1.
2.
Turn on the signal generator: f
gen
= f
i(RF)
+ 4 kHz, no modulation, V
i(RF)
= 1 mV (RMS).
Measure the IF with a counter connected to test pin TPI. Tune C16 to set the crystal oscillator to achieve f
IF
= 4 kHz
Change the generator frequency to f
gen
= f
i(RF)
4 kHz and check that f
IF
is also 4 kHz. For a received input
frequency f
i(RF)
= 172.941 MHz the crystal frequency is f
XTAL
= 57.647 MHz, while for f
i(RF)
= 469.950 MHz the
crystal frequency is f
XTAL
= 78.325 MHz. For a received input frequency f
i(RF)
= 930.500 MHz an external oscillator
signal must be used with f
i(OSC)
= 310.1667 MHz and a level of
15 dBm (for definition of crystal frequency, see
Table 1).
Set the signal generator to nominal frequency (f
i(RF)
) and turn on the modulation deviation
±
4.0 kHz, 600 Hz square
wave modulation, V
i(RF)
= 1 mV (RMS). Note that the RF signal should be reduced in the following tests, as the
receiver is tuned, to ensure V
o(IF)
= 10 to 50 mV (p-p) on test pins TPI or TPQ.
Tune C15 (oscillator output circuit) and C12 (frequency multiplier output) to obtain a peak audio voltage on pin TPI.
Tune C3 and C6 (RF input and mixer input) to obtain a peak audio voltage on pin TPI. When testing the mixer input
sensitivity tune C23 instead of C3 and C6 (test circuit Fig.5).
Check that the output signal on pin TPQ is within 3 dB in amplitude and at 90
°
(
±
20
°
) relative phase of the signal on
pin TPI.
Check that data signal appears on output pin DO and proceed with the AC test.
3.
4.
5.
6.
7.
AC test conditions
Table 5
Definitions for AC test conditions (see Table 6)
SIGNAL
DESCRIPTION
Modulated test signal 1
Frequency
Deviation
Modulation
Rise time
172.941, 469.950 or 930.500 MHz
±
4.0 kHz
1200 baud pseudo random bit sequence
250
±
25
μ
s (between 10% and 90% of final value)
Modulated test signal 2
Deviation
Modulation
±
2.4 kHz
400 Hz sine wave
Other definitions
f
1
f
2
f
3
f
cs
P
1
P
2
P
3
P
i(ref)
frequency of signal generator 1
frequency of signal generator 2
frequency of signal generator 3
channel spacing (20 kHz)
maximum available power from signal generator 1 at the test board input
maximum available power from signal generator 2 at the test board input
maximum available power from signal generator 3 at the test board input
maximum available power at the test board input to give a Bit Error Rate (BER)
3
100
for the modulated
test signal 1, in the absence of interfering signals and under the conditions as specified in Chapters
“AC characteristics (173 MHz)”, “AC characteristics (470 MHz)” and “AC characteristics (930 MHz)”
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