參數(shù)資料
型號: TWR-MCF51CN
廠商: Freescale Semiconductor
文件頁數(shù): 29/48頁
文件大?。?/td> 0K
描述: KIT TOWER BOARD
其它有關(guān)文件: TWR-MCF51CN Schematic
產(chǎn)品培訓(xùn)模塊: MCF51CN Family - Ultimate Ethernet Solutions
Tower System
特色產(chǎn)品: The Tower System
標(biāo)準(zhǔn)包裝: 1
系列: ColdFire®, Flexis™
類型: MCU
適用于相關(guān)產(chǎn)品: Freescale 電源塔系統(tǒng),MCF51CN128
所含物品:
產(chǎn)品目錄頁面: 734 (CN2011-ZH PDF)
配用: TWR-ELEV-ND - TOWER ELEVATOR BOARDS HARDWARE
相關(guān)產(chǎn)品: MCF51CN128CLH-ND - IC MCU 32BIT 128K FLASH 64-LQFP
MCF51CN128CGT-ND - IC MCU 32BIT 128K FLASH 48-QFN
Electrical Characteristics
MCF51CN128 ColdFire Microcontroller Data Sheet, Rev. 4
Freescale Semiconductor
35
3.12.5
Flash Specifications
This section provides details about program/erase times and program-erase endurance for the flash memory.
Program and erase operations do not require any special power sources other than the normal VDD supply. For more detailed
information about program/erase operations, see the Memory section of the MCF51CN128 Reference Manual.
3.13
EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependent on the environment in which the MCU resides. Board
design and layout, circuit topology choices, location and characteristics of external components as well as MCU software
operation all play a significant role in EMC performance. The system designer should consult Freescale applications notes such
as AN2321, AN1050, AN1263, AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC
performance.
Table 22. Flash Characteristics
C
Characteristic
Symbol
Min
Typical
Max
Unit
D
Supply voltage for program/erase
-40
°C to 85 °CV
prog/erase
1.8
3.6
V
D
Supply voltage for read operation
VRead
1.8
3.6
V
D
Internal FCLK frequency1
1 The frequency of this clock is controlled by a software setting.
fFCLK
150
200
kHz
D
Internal FCLK period (1/FCLK)
tFcyc
5—
6.67
μs
P
Longword program time (random location)(2)
tprog
9tFcyc
P
Longword program time (burst mode)(2)
tBurst
4tFcyc
P
Page erase time2
2 These values are hardware state machine controlled. User code does not need to count cycles. This information supplied
for calculating approximate time to program and erase.
tPage
4000
tFcyc
P
Mass erase time(2)
tMass
20,000
tFcyc
D
Longword program current3
3 The program and erase currents are additional to the standard run I
DD. These values are measured at room temperatures
with VDD = 3.3 V, bus frequency = 8.0 MHz.
RIDDBP
9.7
mA
D
Page erase current3
RIDDPE
7.6
mA
C
Program/erase endurance4
TL to TH = –40°C to + 85°C
T = 25
°C
4 Typical endurance for flash was evaluated for this product family on the HC9S12Dx64. For additional information on
how Freescale defines typical endurance, please refer to Engineering Bulletin EB619, Typical Endurance for Nonvolatile
Memory.
10,000
100,000
cycles
C
Data retention5
5 Typical data retention values are based on intrinsic capability of the technology measured at high temperature and
de-rated to 25
°C using the Arrhenius equation. For additional information on how Freescale defines typical data retention,
refer to Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
tD_ret
15
100
years
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
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