參數(shù)資料
型號(hào)： TPS53311RGTR
廠商： TEXAS INSTRUMENTS INC
元件分類： 穩(wěn)壓器
英文描述： SWITCHING REGULATOR, 1210 kHz SWITCHING FREQ-MAX, PQCC16
封裝： 3 X 3 MM, GREEN, PLASTIC, QFN-16
文件頁(yè)數(shù)： 12/26頁(yè)
文件大小： 674K
代理商： TPS53311RGTR
SLUSA41A
– JUNE 2010 – REVISED MARCH 2011
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)(2)
ORDERABLE
MINIMUM
TA
PACKAGE
PINS
OUTPUT SUPPLY
ECO PLAN
NUMBER
QUANTITY
TPS53311RGTR
16
Tape and reel
3000
Plastic QFN
Green (RoHS and
–40°C to 85°C
(RGT)
no Pb/Br)
TPS53311RGTT
16
Mini reel
250
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2)
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range (unless otherwise noted)
VALUE
UNIT
MIN
MAX
VIN, EN
–0.3
7
VBST
–0.3
17
Input voltage range
V
VBST(with respect to SW)
–0.3
7
FB, PS, VDD
–0.3
3.7
DC
–1
7
SW
Pulse
< 20ns, E= 5μJ
–3
10
Output voltage range
PGD
–0.3
7
V
COMP, SYNC
–0.3
3.7
PGND
–0.3
0.3
Human Body Model (HBM)
2000
Electrostatic Discharge
V
Charged Device Model (CDM)
500
Ambient temperature
TA
–40
85
C
Storage temperature
Tstg
–55
150
C
Junction temperature
TJ
–40
150
C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
300
C
(1)
Stresses beyond those listed under
“absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under
“recommended operating
conditions
” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
Copyright
2010–2011, Texas Instruments Incorporated
Product Folder Link(s) :TPS53311
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