參數(shù)資料
型號: TPA4411MRTJ
廠商: Texas Instruments, Inc.
英文描述: 80-mW DIRECTPATH STEREO HEADPHONE DRIVER
中文描述: 80毫瓦DIRECTPATH立體聲耳機(jī)驅(qū)動(dòng)器
文件頁數(shù): 3/33頁
文件大?。?/td> 1025K
代理商: TPA4411MRTJ
www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range, T
A
= 25
°
C (unless otherwise noted)
TPA4411
TPA4411M
SLOS430C–AUGUST 2004–REVISED DECEMBER 2006
TERMINAL FUNCTIONS
TERMINAL
QFN
I/O
DESCRIPTION
NAME
C1P
PGND
C1N
WCSP
A4
B4
C4
1
2
3
I/O
I
I/O
Charge pump flying capacitor positive terminal
Power ground, connect to ground.
Charge pump flying capacitor negative terminal
4, 6, 8,
12, 16,
20
5
7
9
10
11
13
14
15
17
18
19
NC
B3, C3
No connection
PVSS
SVSS
OUTL
SVDD
OUTR
INL
SDR
INR
SGND
SDL
PVDD
D4
D3
D2
D1
C2
C1
B1
A1
A2
B2
A3
O
I
O
I
O
I
I
I
I
I
I
Output from charge pump.
Amplifier negative supply, connect to PVSS via star connection.
Left audio channel output signal
Amplifier positive supply, connect to PVDD via star connection.
Right audio channel output signal
Left audio channel input signal
Right channel shutdown, active low logic.
Right audio channel input signal
Signal ground, connect to ground.
Left channel shutdown, active low logic.
Supply voltage, connect to positive supply.
Exposed Pad
-
Exposed pad must be soldered to a floating plane. Do NOT connect to power or ground.
VALUE / UNIT
–0.3 V to 5.5 V
–0.3 V to V
DD
+ 0.3 V
See Dissipation Rating Table
–40
°
C to 85
°
C
–40
°
C to 150
°
C
–65
°
C to 85
°
C
260
°
C
Supply voltage, AVDD, PVDD
Input voltage
Output Continuous total power dissipation
Operating free-air temperature range
Operating junction temperature range
Storage temperature range
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
V
I
T
A
T
J
T
stg
(1)
Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
recommended operating
conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
3
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