參數(shù)資料
    型號(hào): TMX320LF2402AVFA
    廠商: Texas Instruments, Inc.
    元件分類: 數(shù)字信號(hào)處理
    英文描述: DSP CONTROLLERS
    中文描述: DSP控制器
    文件頁(yè)數(shù): 16/134頁(yè)
    文件大?。?/td> 1759K
    代理商: TMX320LF2402AVFA
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    TMS320LF2407A,TMS320LF2406A,TMS320LF2403A,TMS320LF2402A
    TMS320LC2406A,TMS320LC2404A,TMS320LC2403A,TMS320LC2402A
    DSP CONTROLLERS
    SPRS145K
    JULY 2000
    REVISED AUGUST 2005
    16
    POST OFFICE BOX 1443
    HOUSTON, TEXAS 77251
    1443
    pin functions (continued)
    Table 2. LF240xA and LC240xA Pin List and Package Options
    (Continued)
    PIN NAME
    LF2407A
    (144-PGE)
    2406A
    (100-PZ)
    LC2404A
    (100-PZ)
    2403A,
    LC2402A
    (64-PAG)
    and
    2402A
    (64-PG)
    DESCRIPTION
    EMULATION AND TEST (CONTINUED)
    TDI
    139
    96
    96
    30
    JTAG test data input (TDI) with internal pullup. TDI
    is clocked into the selected register (instruction or
    data) on a rising edge of TCK.
    (
    )
    TDO
    142
    99
    99
    31
    JTAG scan out, test data output (TDO). The
    contents of the selected register (instruction or
    data) is shifted out of TDO on the falling edge of
    TCK.
    (
    )
    JTAG test-mode select (TMS) with internal pullup.
    This serial control input is clocked into the TAP
    controller on the rising edge of TCK.
    TMS
    144
    100
    100
    32
    (
    )
    TMS2
    36
    25
    25
    48
    JTAG test-mode select 2 (TMS2) with internal
    pullup. This serial control input is clocked into the
    TAP controller on the rising edge of TCK. Used for
    test and emulation only. This pin can be left
    unconnected in user applications. If the PLL bypass
    mode is desired, TMS2, TMS, and TRST should be
    held low during reset.
    (
    )
    TRST
    1
    1
    1
    33
    JTAG test reset with internal pulldown. TRST, when
    driven high, gives the scan system control of the
    operations of the device. If this signal is not
    connected or driven low, the device operates in its
    functional mode, and the test reset signals are
    ignored.
    (
    )
    NOTE: Do not use pullup resistors on TRST; it has
    an internal pulldown device. TRST is an active high
    test pin and must be maintained low at all times
    during normal device operation. In a low-noise
    environment, TRST may be left floating. In other
    instances, an external pulldown resistor is highly
    recommended. The value of this resistor should be
    based on drive strength of the debugger pods
    applicable to the design. A 2.2-k
    resistor generally
    offers
    adequate
    protection.
    application
    specific, it is recommended that each
    target board be validated for proper operation of the
    debugger and the application. (I
    )
    Since
    this
    is
    Bold, italicized pin names
    indicate pin function after reset.
    GPIO
    General-purpose input/output pin. All GPIOs come up as input after reset.
    §
    It is highly recommended that V
    CCA
    be isolated from the digital supply voltage (and V
    SSA
    from digital ground) to maintain the specified accuracy
    and improve the noise immunity of the ADC.
    Only when all of the following conditions are met: EMU1/OFF is low, TRST is low, and EMU0 is high
    #
    No power supply pin (V
    DD
    , V
    DDO
    , V
    SS
    , or V
    SSO
    ) should be left unconnected. All power supply pins must be connected appropriately for proper
    device operation.
    LEGEND:
    Internal pullup
    Internal pulldown
    (Typical active pullup/pulldown value is
    ±
    16
    μ
    A.)
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