
Preliminary
www.taimec.com.tw
/
www.class-d.com.tw
TMPA420DS
Rev.3.0 August 15, 2007
t
ai'mec
TERMINAL FUNCTIONS
Copyright
2005,Tai-1 Microelectronics Corp.
4
TERMINAL
NAME
PIN NO
I/O
DESCRIPTION
AGND
AVCC
AVDD
HFVDDR
HFVDDL
HFRC
LINN
LINP
LOUTN
LOUTP
PGNDL
PGNDR
PVCCL
PVCCR
RINP
RINN
ROUTN
ROUTP
SD
8,26,30
33
28
4
7
27
6
5
16,17
20,21
18,19
42,43
14,15,22,23
38,39,46,47
3
2
44,45
40,41
1
-
-
I
O
O
O
I
I
O
O
-
-
-
-
I
I
O
O
I
Analog ground
High-voltage power supply (8V to 15V)
5-V voltage
2.5-V Reference for convenience of single-ended inputs
2.5-V Reference for convenience of single-ended inputs
Power up delay
Negative differential input for left channel
Positive differential input for left channel
Class-D negative output for left channel
Class-D positive output for left channel
Power ground for left channel
Power ground for right channel
Power supply for left channel(8V to 15V)
Power supply for right channel(8V to 15V)
Positive differential input for right channel
Negative differential input for right channel
Class-D negative output for right channel
Class-D positive output for right channel
Shutdown (Low valid)
GAIN0
GAIN1
VDDZ
9
10
29
I
I
O
Gain0 control
Gain1 control
5-V Regulated output (25mA output)
NC
11,12,13,24,
25,31,32,34,
35, 36,37,48
-
No connection
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range unless otherwise noted(1)
In normal mode
In shutdown mode
-0.3V to 17V
-0.3V to 17V
-0.3V to AV
CC
+0.3V
-0.3V to 5V
See package dissipation ratings
-20 to 85
-20 to 150
-40 to 150
V
V
V
V
Supply voltage, PV
CCR
, PV
CCL,
Av
CC
(
I
load=0)
Input voltage, SD
Input voltage, Gain0, Gain1, LINN, LINP, RINN, RINP
Continuous total power dissipation
Operating free-air temperature, T
A
Operating junction temperature, T
J
Storage temperature, T
stg
(1) Stresses beyond those listed under
”
absolute maximum ratings
”
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
“
recommended operating
conditions
“
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
。
C
。
C
。
C
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