TLV320AIC28
SLAS418B FEBRUARY 2004 REVISED MAY 2005
www.ti.com
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sampling of the signal. Moreover, additional times, such as the panel voltage stabilization time, can add
significantly to the time it takes to perform a conversion. Conversion time can vary depending upon the mode
in which the AIC28 is used. Throughout this data sheet, internal and conversion clock cycles are used to
describe the times that many functions take to execute. Considering the total system design, these times must
be taken into account by the user.
When both the audio ADC and DAC are powered down, the auxiliary ADC uses an internal oscillator for
conversions. However, to save power whenever audio ADC or DAC are powered up, the internal oscillator is
powered down and MCLK and BCLK are used to clock the auxiliary ADC.
The AIC28 uses the programmed value of bit D13 in control register 06H/page 2 and the PLL programmability
to derive a clock from MCLK. The various combinations are listed in Table 3.
Table 3. Conversion Clock Frequency
D13=0 (in control register 06H/page 2)
D13=1 (in control register 06H/page 2)
PLL enabled
160
13
×
P
K
MCLK
192
17
×
P
K
MCLK
PLL disabled
10
13
×
Q
MCLK
12
17
×
Q
MCLK
Temperature Measurement
In some applications, such as battery charging, a measurement of ambient temperature is required. The
temperature measurement technique used in the AIC28 relies on the characteristics of a semiconductor
junction operating at a fixed current level. The forward diode voltage (VBE) has a well-defined characteristic
versus temperature. The ambient temperature can be predicted in applications by knowing the 25
°C value of
the VBE voltage and then monitoring the variation of that voltage as the temperature changes.
The AIC28 offers two modes of temperature measurement. The first mode requires a single reading to predict
the ambient temperature. A diode, as shown in Figure 25, is used during this measurement cycle. This voltage
is typically 600 mV at +25
°C with a 20-A current through it. The absolute value of this diode voltage can vary
a few millivolts. The temperature coefficient of this voltage is typically 2 mV/
°C. During the final test of the end
product, the diode voltage at a known room temperature should be stored in nonvolatile memory. Further
calibration can be done to calculate the precise temperature coefficient of the particular. This method has a
temperature resolution of approximately 0.3
°C/LSB and accuracy of approximately ±2°C with two-temperature
calibration. Figure 26 and Figure 27 shows typical plots with single and two-temperature calibration
respectively.
TEMP0
TEMP1
Temperature Select
X+
MUX
A/D
Converter
Figure 25. Functional Block Diagram of Temperature Measurement Mode